Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Pamela del Vecchio"'
Autor:
Nathalie Labat, Laurent Bechou, François Laruelle, Arnaud Curutchet, Pamela del Vecchio, Mauro Bettiati, Yannick Deshayes
Publikováno v:
Microelectronics Reliability. 55:1741-1745
Highlights • We observe atypical laser diode (LD) signatures in reverse I-V measurement identified as microplasma discharges. • Correlation between reverse I-V signatures and LFN measurements appears as a complementary tool for improvement of scr
Autor:
Stéphane Grauby, Laurent Bechou, Jérémy Michaud, Pamela del Vecchio, Mauro Bettiati, David Veyrie, François Laruelle
Publikováno v:
IEEE Photonics Technology Letters
IEEE Photonics Technology Letters, Institute of Electrical and Electronics Engineers, 2015, 27 (9), pp.1002-1005. ⟨10.1109/LPT.2015.2405090⟩
IEEE Photonics Technology Letters, Institute of Electrical and Electronics Engineers, 2015, 27 (9), pp.1002-1005. ⟨10.1109/LPT.2015.2405090⟩
International audience; A thermoreflectance technique is used to evaluate the temperature variations at the output facet of high-power GaAs-based laser diodes emitting at 980 nm. Two kinds of diodes with different unpumped windows (UPWs) are studied
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41e322b4e1d580ace9b7507ac737fb62
https://hal.archives-ouvertes.fr/hal-01155505
https://hal.archives-ouvertes.fr/hal-01155505
Autor:
Mauro Bettiati, Pamela del Vecchio, Yannick Deshayes, François Laruelle, Laurent Bechou, Simon Joly
Publikováno v:
Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement
SPIE Photonics Europe 2014: Photonics, Optics, Lasers, Micro-and Nanotechnologies
SPIE Photonics Europe 2014: Photonics, Optics, Lasers, Micro-and Nanotechnologies, Apr 2014, Brussels, Belgium. pp.9134:913423, ⟨10.1117/12.2052179⟩
SPIE Photonics Europe 2014: Photonics, Optics, Lasers, Micro-and Nanotechnologies
SPIE Photonics Europe 2014: Photonics, Optics, Lasers, Micro-and Nanotechnologies, Apr 2014, Brussels, Belgium. pp.9134:913423, ⟨10.1117/12.2052179⟩
International audience; In this study, we report on a methodology based on reverse and forward current-voltage curves (I-V) and on Degree of Polarization (DoP) of electroluminescence measurements on 980 nm laser diodes chip-on-submount (CoS) for the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e3ce4abc8c0c728a7c2ab7a9cf5a464
https://hal.archives-ouvertes.fr/hal-00991556
https://hal.archives-ouvertes.fr/hal-00991556
This paper reports the hardening principles and the first characterization of an optocoupler structure that uses a Vertical Cavity Surface Emitting Laser (VCSEL) as a light emitter. Current Transfer Ratio (CTR) measurements carried out before and aft
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::76cb03ee04b6a52eb8fa668e1bbcffa9
https://hal.archives-ouvertes.fr/hal-00786227
https://hal.archives-ouvertes.fr/hal-00786227