In Situ Measurement of Voltage-Induced Stress in Conducting Polymers with Redox-Active Dopants.

Autor: Sen S; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Kim SY; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Palmore LR; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Jin S; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Jadhav N; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Chason E; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States., Palmore GT; Department of Chemistry and ‡School of Engineering, Brown University , Providence, Rhode Island 02912, United States.

Publikováno v: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Sep 14; Vol. 8 (36), pp. 24168-76. Date of Electronic Publication: 2016 Aug 31.