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pro vyhledávání: '"Paine, Amelia W."'
Autor:
de Wit, Xander M., Paine, Amelia W., Martin, Caroline, Goldfain, Aaron M., Garmann, Rees F., Manoharan, Vinothan N.
Publikováno v:
Applied Optics 62, 7205-7215 (2023)
Interferometric scattering microscopy (iSCAT) can image the dynamics of nanometer-scale systems. The typical approach to analyzing interferometric images involves intensive processing, which discards data and limits the precision of measurements. We
Externí odkaz:
http://arxiv.org/abs/2307.01730
