Zobrazeno 1 - 10
of 51
pro vyhledávání: '"PROBE CHARACTERIZATION"'
Akademický článek
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Publikováno v:
Sensors, Vol 20, Iss 24, p 7196 (2020)
Air-coupled ultrasonic probes require a special design approach and handling due to the significant mismatch to the air. Outer matching layers have to be soft so can be easily damaged and excitation voltages might cause the degradation of electrodes
Externí odkaz:
https://doaj.org/article/59a7f39fddf54e28a843bcbc51b3df66
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Akademický článek
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Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
instname
Most ultrasonic probes present a layered structure that may comprise delay lines, acoustic lens, wear plates, matching layers, electrodes, piezoelectric layers, and a backing block. Probe integrity can be compromised by different defects, such as def
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c8fafa81599a93e0bc87649caaeafa61
http://hdl.handle.net/10261/233234
http://hdl.handle.net/10261/233234
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
Sensors (Basel, Switzerland)
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Sensors, Vol 20, Iss 7196, p 7196 (2020)
Sensors
Volume 20
Issue 24
instname
Sensors (Basel, Switzerland)
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Sensors, Vol 20, Iss 7196, p 7196 (2020)
Sensors
Volume 20
Issue 24
© 2020 by the authors.
Air-coupled ultrasonic probes require a special design approach and handling due to the significant mismatch to the air. Outer matching layers have to be soft so can be easily damaged and excitation voltages might cause t
Air-coupled ultrasonic probes require a special design approach and handling due to the significant mismatch to the air. Outer matching layers have to be soft so can be easily damaged and excitation voltages might cause t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e59e9c2e233529fadfc047f3b0c72f4
http://hdl.handle.net/10261/225727
http://hdl.handle.net/10261/225727
Publikováno v:
Journal of synchrotron radiation 24(2), 498-505 (2017). doi:10.1107/S160057751700128X
Journal of Synchrotron Radiation
Journal of Synchrotron Radiation
Journal of synchrotron radiation 24(2), 498 - 505 (2017). doi:10.1107/S160057751700128X
In X-ray holographic near-field imaging the resolution and image quality depend sensitively on the beam. Artifacts are often encountered due to the strong fo
In X-ray holographic near-field imaging the resolution and image quality depend sensitively on the beam. Artifacts are often encountered due to the strong fo
Publikováno v:
2019 Joint MMM-Intermag, Jan 2019
2019 Joint MMM-Intermag, Jan 2019, Jan 2019, Washington, United States
2019 Joint MMM-Intermag, Jan 2019, Jan 2019, Washington, United States
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::630013135dfbe805dcaa7dc30cfa2005
https://hal.archives-ouvertes.fr/hal-02560987
https://hal.archives-ouvertes.fr/hal-02560987
Autor:
B. Laterza, M. Fincato, Pierluigi Veltri, Emanuele Sartori, V. Cervaro, Gianluigi Serianni, G. Moro, M. Cavenago, L. Buonincontri
Publikováno v:
17th International Conference on Ion Sources-ICIS 2017, Geneva, Switzerland, October 15-20, 2017
info:cnr-pdr/source/autori:Veltri Pierluigi; Buonincontri Laura; Sartori Emanuele; Cavenago Marco; Cervaro Vannino; Fincato Michele; Laterza Bruno; Moro Gianluca; Serianni Gianluigi/congresso_nome:17th International Conference on Ion Sources-ICIS 2017/congresso_luogo:Geneva, Switzerland/congresso_data:October 15-20, 2017/anno:2017/pagina_da:/pagina_a:/intervallo_pagine
17th International Conference on Ion Sources (ICIS 2017), pp. 050011-1–050011-3, Geneva (Switzerland), September 15-20, 2017
info:cnr-pdr/source/autori:Veltri P.; Buonincontri L.; Sartori E.; Cervaro V.; Fincato M.; Laterza B.; Moro G.; Cavenago M.; Serianni G./congresso_nome:17th International Conference on Ion Sources (ICIS 2017)/congresso_luogo:Geneva (Switzerland)/congresso_data:September 15-20, 2017/anno:2018/pagina_da:050011-1/pagina_a:050011-3/intervallo_pagine:050011-1–050011-3
info:cnr-pdr/source/autori:Veltri Pierluigi; Buonincontri Laura; Sartori Emanuele; Cavenago Marco; Cervaro Vannino; Fincato Michele; Laterza Bruno; Moro Gianluca; Serianni Gianluigi/congresso_nome:17th International Conference on Ion Sources-ICIS 2017/congresso_luogo:Geneva, Switzerland/congresso_data:October 15-20, 2017/anno:2017/pagina_da:/pagina_a:/intervallo_pagine
17th International Conference on Ion Sources (ICIS 2017), pp. 050011-1–050011-3, Geneva (Switzerland), September 15-20, 2017
info:cnr-pdr/source/autori:Veltri P.; Buonincontri L.; Sartori E.; Cervaro V.; Fincato M.; Laterza B.; Moro G.; Cavenago M.; Serianni G./congresso_nome:17th International Conference on Ion Sources (ICIS 2017)/congresso_luogo:Geneva (Switzerland)/congresso_data:September 15-20, 2017/anno:2018/pagina_da:050011-1/pagina_a:050011-3/intervallo_pagine:050011-1–050011-3
In view of the future experiments on the large ion sources used for the neutral beam injection system of ITER and DEMO reactor, a small scale negative ions source called NIO1 (Negative Ion Optimization, phase 1) is operated at Consorzio RFX since 201