Correlation between 1064 nm laser attack and thermal behavior in STT-MRAM

Autor: Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Sousa, R.C., Di Pendina, G., Canet, P.

Publikováno v: In Microelectronics Reliability November 2023 150

1T-NOR Flash memory after endurance degradation: An advanced TCAD simulation

Autor: Matteo, F., Simola, R., Postel-Pellerin, J., Coulié, K.

Publikováno v: In Microelectronics Reliability November 2022 138

Effects of depression and cognitive impairment on quality of life in older adults with schizophrenia spectrum disorder: Results from a multicenter study

Autor: Adès, J., Alezrah, C., Amado, I., Amar, G., Andréi, O., Arbault, D., Archambault, G., Aurifeuille, G., Barrière, S., Béra-Potelle, C., Blumenstock, Y., Bardou, H., Bareil-Guérin, M., Barrau, P., Barrouillet, C., Baup, E., Bazin, N., Beaufils, B., Ben Ayed, J., Benoit, M., Benyacoub, K., Bichet, T., Blanadet, F., Blanc, O., Blanc-Comiti, J., Boussiron, D., Bouysse, A.M., Brochard, A., Brochart, O., Bucheron, B., Cabot, M., Camus, V., Chabannes, J.M., Charlot, V., Charpeaud, T., Clad-Mor, C., Combes, C., Comisu, M., Cordier, B., Costi, F., Courcelles, J.P., Creixell, M., Cuche, H., Cuervo-Lombard, C., Dammak, A., Da Rin, D., Denis, J.B., Denizot, H., Deperthuis, A., Diers, E., Dirami, S., Donneau, D., Dreano, P., Dubertret, C., Duprat, E., Duthoit, D., Fernandez, C., Fonfrede, P., Freitas, N., Gasnier, P., Gauillard, J., Getten, F., Gierski, F., Godart, F., Gourevitch, R., Grassin Delyle, A., Gremion, J., Gres, H., Griner, V., Guerin-Langlois, C., Guggiari, C., Guillin, O., Hadaoui, H., Haffen, E., Hanon, C., Haouzir, S., Hazif-Thomas, C., Heron, A., Hoertel, N., Hubsch, B., Jalenques, I., Januel, D., Kaladjian, A., Karnycheff, J.F., Kebir, O., Krebs, M.O., Lajugie, C., Leboyer, M., Legrand, P., Lejoyeux, M., Lemaire, V., Leroy, E., Levy-Chavagnat, D., Leydier, A., Liling, C., Limosin, F., Llorca, P.M., Loeffel, P., Louville, P., Lucas Navarro, S., Mages, N., Mahi, M., Maillet, O., Manetti, A., Martelli, C., Martin, P., Masson, M., Maurs-Ferrer, I., Mauvieux, J., Mazmanian, S., Mechin, E., Mekaoui, L., Meniai, M., Metton, A., Mihoubi, A., Miron, M., Mora, G., Niro Adès, V., Nubukpo, P., Omnes, C., Papin, S., Paris, P., Passerieux, C., Pellerin, J., Perlbarg, J., Perron, S., Petit, A., Petitjean, F., Portefaix, C., Pringuey, D., Radtchenko, A., Rahiou, H., Raucher-Chéné, D., Rauzy, A., Reinheimer, L., Renard, M., René, M., Rengade, C.E., Reynaud, P., Robin, D., Rodrigues, C., Rollet, A., Rondepierre, F., Rousselot, B., Rubingher, S., Saba, G., Salvarelli, J.P., Samuelian, J.C., Scemama-Ammar, C., Schurhoff, F., Schuster, J.P., Sechter, D., Segalas, B., Seguret, T., Seigneurie, A.S., Semmak, A., Slama, F., Taisne, S., Taleb, M., Terra, J.L., Thefenne, D., Tran, E., Tourtauchaux, R., Vacheron, M.N., Vandel, P., Vanhoucke, V., Venet, E., Verdoux, H., Viala, A., Vidon, G., Vitre, M., Vurpas, J.L., Wagermez, C., Walter, M., Yon, L., Zendjidjian, X., Pascal de Raykeer, Rachel, Hoertel, Nicolas, Blanco, Carlos, Lavaud, Pierre, Kaladjian, Arthur, Blumenstock, Yvonne, Cuervo-Lombard, Christine-Vanessa, Peyre, Hugo, Lemogne, Cédric, Limosin, Frédéric

Publikováno v: In Journal of Affective Disorders 1 September 2019 256:164-175

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction

Autor: Della Marca, V., Postel-Pellerin, J., Kempf, T., Regnier, A., Chiquet, P., Bocquet, M.

Publikováno v: In Microelectronics Reliability September 2018 88-90:159-163

Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories

Autor: Canet, P., Postel-Pellerin, J., Aziza, H.

Publikováno v: In Microelectronics Reliability September 2016 64:36-41