Experimental analysis on stochastic behavior of preswitching time in STT-MRAM

Autor: Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Terziyan, K., Nadifi, S., Sousa, R.C., Canet, P., Di Pendina, G.

Publikováno v: In Microelectronics Reliability November 2022 138

On: 'A numerical evaluation of electromagnetic methods in geothermal exploration' (L. Pellerin, J. M. Johnston, and G. W. Hohmann, GEOPHYSICS, 61, 121–130)

Autor: L. Pellerin, M. Poddar, J. M. Johnston

Publikováno v: GEOPHYSICS. 62:2000-2002

Pellerin et al. numerically modeled electromagnetic response of a geothermal body of very large size at a shallow depth and found the task difficult, specially, at high frequencies (and hence early times) due to practical limits on computing time and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::95e595bcb4f19ebdf72b80c00c7405d2
https://doi.org/10.1190/1.1487037

Effects of depression and cognitive impairment on quality of life in older adults with schizophrenia spectrum disorder: Results from a multicenter study

Autor: Adès, J., Alezrah, C., Amado, I., Amar, G., Andréi, O., Arbault, D., Archambault, G., Aurifeuille, G., Barrière, S., Béra-Potelle, C., Blumenstock, Y., Bardou, H., Bareil-Guérin, M., Barrau, P., Barrouillet, C., Baup, E., Bazin, N., Beaufils, B., Ben Ayed, J., Benoit, M., Benyacoub, K., Bichet, T., Blanadet, F., Blanc, O., Blanc-Comiti, J., Boussiron, D., Bouysse, A.M., Brochard, A., Brochart, O., Bucheron, B., Cabot, M., Camus, V., Chabannes, J.M., Charlot, V., Charpeaud, T., Clad-Mor, C., Combes, C., Comisu, M., Cordier, B., Costi, F., Courcelles, J.P., Creixell, M., Cuche, H., Cuervo-Lombard, C., Dammak, A., Da Rin, D., Denis, J.B., Denizot, H., Deperthuis, A., Diers, E., Dirami, S., Donneau, D., Dreano, P., Dubertret, C., Duprat, E., Duthoit, D., Fernandez, C., Fonfrede, P., Freitas, N., Gasnier, P., Gauillard, J., Getten, F., Gierski, F., Godart, F., Gourevitch, R., Grassin Delyle, A., Gremion, J., Gres, H., Griner, V., Guerin-Langlois, C., Guggiari, C., Guillin, O., Hadaoui, H., Haffen, E., Hanon, C., Haouzir, S., Hazif-Thomas, C., Heron, A., Hoertel, N., Hubsch, B., Jalenques, I., Januel, D., Kaladjian, A., Karnycheff, J.F., Kebir, O., Krebs, M.O., Lajugie, C., Leboyer, M., Legrand, P., Lejoyeux, M., Lemaire, V., Leroy, E., Levy-Chavagnat, D., Leydier, A., Liling, C., Limosin, F., Llorca, P.M., Loeffel, P., Louville, P., Lucas Navarro, S., Mages, N., Mahi, M., Maillet, O., Manetti, A., Martelli, C., Martin, P., Masson, M., Maurs-Ferrer, I., Mauvieux, J., Mazmanian, S., Mechin, E., Mekaoui, L., Meniai, M., Metton, A., Mihoubi, A., Miron, M., Mora, G., Niro Adès, V., Nubukpo, P., Omnes, C., Papin, S., Paris, P., Passerieux, C., Pellerin, J., Perlbarg, J., Perron, S., Petit, A., Petitjean, F., Portefaix, C., Pringuey, D., Radtchenko, A., Rahiou, H., Raucher-Chéné, D., Rauzy, A., Reinheimer, L., Renard, M., René, M., Rengade, C.E., Reynaud, P., Robin, D., Rodrigues, C., Rollet, A., Rondepierre, F., Rousselot, B., Rubingher, S., Saba, G., Salvarelli, J.P., Samuelian, J.C., Scemama-Ammar, C., Schurhoff, F., Schuster, J.P., Sechter, D., Segalas, B., Seguret, T., Seigneurie, A.S., Semmak, A., Slama, F., Taisne, S., Taleb, M., Terra, J.L., Thefenne, D., Tran, E., Tourtauchaux, R., Vacheron, M.N., Vandel, P., Vanhoucke, V., Venet, E., Verdoux, H., Viala, A., Vidon, G., Vitre, M., Vurpas, J.L., Wagermez, C., Walter, M., Yon, L., Zendjidjian, X., Pascal de Raykeer, Rachel, Hoertel, Nicolas, Blanco, Carlos, Lavaud, Pierre, Kaladjian, Arthur, Blumenstock, Yvonne, Cuervo-Lombard, Christine-Vanessa, Peyre, Hugo, Lemogne, Cédric, Limosin, Frédéric

Publikováno v: In Journal of Affective Disorders 1 September 2019 256:164-175

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction

Autor: Della Marca, V., Postel-Pellerin, J., Kempf, T., Regnier, A., Chiquet, P., Bocquet, M.

Publikováno v: In Microelectronics Reliability September 2018 88-90:159-163

Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories

Autor: Canet, P., Postel-Pellerin, J., Aziza, H.

Publikováno v: In Microelectronics Reliability September 2016 64:36-41