Zobrazeno 1 - 10
of 50
pro vyhledávání: '"PCMOS"'
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28:596-606
As the feature size of CMOS technology rapidly shrinks into the very deep submicrometer, the power density is getting higher and the circuit’s reliability is seriously impacted by thermal noise. In order to reduce power dissipation, decreasing the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e98a489013e9aab13a2aca67adce8255
https://doi.org/10.1109/tvlsi.2019.2945083
https://doi.org/10.1109/tvlsi.2019.2945083
Publikováno v:
Tehran University Medical Journal, Vol 69, Iss 11, Pp 695-702 (2012)
Background: The characteristic of stem cells in self renewal and differentiation to different types of cells has stimulated the interests for using stem cells as a starting material for generating insulin secreting cells. We've evaluated the differen
Externí odkaz:
https://doaj.org/article/5575aae6cd2646e7b9658824f9a1e60a
Autor:
George, Jason
A central component of modern computing is the idea that computation requires determinism. Contrary to this belief, the primary contribution of this work shows that useful computation can be accomplished in an error-prone fashion. Focusing on low-pow
Externí odkaz:
http://hdl.handle.net/1853/42812
Parameter variations, noise susceptibility, and increasing energy dissipation of CMOS devices have been recognized as major challenges in circuit and micro-architecture design in the nanometer regime. Among these, parameter variations and noise susce
Externí odkaz:
http://hdl.handle.net/1853/26706
Publikováno v:
IEEE Transactions on Magnetics. 53:1-10
This paper focuses on the design, performance modeling, and evaluation of probabilistic logic using superparamagnetic nanomagnets for which there exists a strong interplay between deterministic dynamics and intrinsic thermal noise. The switching elem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74b549269d70a8ac9f8d20a5552c8dfa
https://doi.org/10.1109/tmag.2017.2696041
https://doi.org/10.1109/tmag.2017.2696041
Publikováno v:
High Performance Embedded Computing Handbook ISBN: 9781315221908
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6fd9b78b9e7fe14418e073639c77eed
https://doi.org/10.1201/9781315221908-31
https://doi.org/10.1201/9781315221908-31
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Jin-Tai Yan
Publikováno v:
Integration. 47:452-460
Due to the effect of thermal noise, ground bounce and process variations in nanometer process, the behavior of any logical circuit becomes increasingly probabilistic. In this paper, based on the noise model [5] on the input and output nodes of a prob
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25c71de109f65c28b731d37dda38efcb
https://doi.org/10.1016/j.vlsi.2014.02.002
https://doi.org/10.1016/j.vlsi.2014.02.002
Publikováno v:
IEEE Transactions on Circuits and Systems for Video Technology. 24:1-14
As CMOS technology driven by Moore's law has approached device sizes in the range of 5-20 nm, noise immunity of such future technology nodes is predicted to decrease considerably, eventually affecting the reliability of computations through them. A s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6e185e576c2dce0a5d2b0d6f004aca5
https://doi.org/10.1109/tcsvt.2013.2273627
https://doi.org/10.1109/tcsvt.2013.2273627
Publikováno v:
ACM Transactions on Embedded Computing Systems. 13:1-30
Quick and accurate error-rate prediction of Probabilistic CMOS (PCMOS) circuits is crucial for their systematic design and performance evaluation. While still in the early stage of research, PCMOS has shown potential to drastically reduce energy cons
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95bd859d21e15ba7753e51c23bd42f63
https://doi.org/10.1145/2536747.2536761
https://doi.org/10.1145/2536747.2536761