Novel control for delay-locked loop in IR-UWB communication systems

Autor: Kosai Raoof, Rshdee Alhakim, Emmanuel Simeu

Publikováno v: Control Engineering Practice
Control Engineering Practice, Elsevier, 2013, 21 (10), pp.1437-1454. ⟨10.1016/j.conengprac.2013.06.014⟩

International audience; Timing synchronization represents a major challenge in carrying out highly efficient ultra-wideband (UWB) communications. The delay-locked loop (DLL) method is widely proposed to maintain the satisfactory synchronization and r

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a831b3cbe4ddfebab7e7a5c6c919aa0
https://doi.org/10.1016/j.conengprac.2013.06.014

Electroacoustic Analysis of a Controlled Damping Planar CMOS-MEMS Electrodynamic Microphone

Autor: Mohamed Masmoudi, Brahim Mezghani, Libor Rufer, Fares Tounsi

Publikováno v: Archives of Acoustics
Archives of Acoustics, 2015, 40 (4), pp.527-537. ⟨10.1515/aoa-2015-0052⟩
archives of acoustics
archives of acoustics, 2015, 40 (4), pp.527-537. ⟨10.1515/aoa-2015-0052⟩

This paper gives a detailed electroacoustic study of a new generation of monolithic CMOS micromachined electrodynamic microphone, made with standard CMOS technology. The monolithic integration of the mechanical sensor with the electronics using a sta

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4438af98a5e8c899b085041b5190d48
https://hal.science/hal-01332221

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs

Autor: Dubois, M., Stratigopoulos, Haralampos-G, Mir, Salvador, Barragan, M.

Publikováno v: IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14)
IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14), Oct 2014, Playa del Carmen, Mexico, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004153⟩

International audience; Validation of an embedded test technique in terms of its expected yield loss and test escape metrics is a key step before it can be deployed in high-volume manufacturing. However, performing this validation at the design stage

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::bc980cf38dcd9394503c74cac4de1975
https://hal.archives-ouvertes.fr/hal-01118108

Trends in mixed-signal test cost in current and future ICs

Autor: Mir, Salvador

Publikováno v: Panel moderator at 19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14)
Panel moderator at 19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), Sep 2014, Porto Alegre, Brazil

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::e0c3d4386d41bd807624568638650ef7
https://hal.archives-ouvertes.fr/hal-01118046

Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes

Autor: Jose Silva-Martinez, Xavier Perpiñà, Eduardo Aldrete-Vidrio, Xavier Jordà, Josep Altet, Didac Gómez, Ferran Reverter, Haralampos-G. Stratigopoulos, Baudouin Martineau, Miquel Vellvehi, Louay Abdallah, Xavier Aragones, Stefan Dilhaire, Salvador Mir, Diego Mateo, José Luis González, Marvin Onabajo

Publikováno v: 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14)
57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), Aug 2014, Texas, United States. pp.1081-1084, ⟨10.1109/MWSCAS.2014.6908606⟩
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
Universitat Jaume I
MWSCAS

International audience; This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4646dad2352feea6dc56ab600e78dac8
https://hal.archives-ouvertes.fr/hal-01118149