Zobrazeno 1 - 10
of 26
pro vyhledávání: '"PACS 85"'
Autor:
Luca Ferro, Laurence Pierre
Publikováno v:
IEEE Transactions on Computers
IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2008, 57 (10), pp.1346-1356. ⟨10.1109/TC.2008.74⟩
IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2008, 57 (10), pp.1346-1356. ⟨10.1109/TC.2008.74⟩
International audience; The TLM modeling level of the SystemC language emphasizes the transactions in a complex system, considered at a very high level of abstraction. This level of specification considerably improves simulation performance and is th
Publikováno v:
IEEE International Conference on Electronics, Circuits and Systems (ICECS'08)
IEEE International Conference on Electronics, Circuits and Systems (ICECS'08), Sep 2008, Saint Julians, Malta. pp.113-116
HAL
ICECS
IEEE International Conference on Electronics, Circuits and Systems (ICECS'08), Sep 2008, Saint Julians, Malta. pp.113-116
HAL
ICECS
ISBN : 978-1-4244-2182-4; International audience; Fault-injection based dependability analysis has proved to be an efficient mean to predict the behavior of a circuit in presence of faults. Emulation-based approaches enable fast and flexible analyses
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::356167e98625274e1291017d6db14739
https://hal.archives-ouvertes.fr/hal-00322962
https://hal.archives-ouvertes.fr/hal-00322962
Autor:
Marc Renaudin, Eslam Yahya
Publikováno v:
15th IEEE International Conference on Electronics, Circuits and Systems (ICECS'08)
15th IEEE International Conference on Electronics, Circuits and Systems (ICECS'08), Aug 2008, Saint Julians, Malta. pp.1285-1289
ICECS
15th IEEE International Conference on Electronics, Circuits and Systems (ICECS'08), Aug 2008, Saint Julians, Malta. pp.1285-1289
ICECS
ISBN : 978-1-4244-2182-4; International audience; This paper introduces a new methodology for optimizing the performance of Asynchronous-Linear Pipelines. The method supports all delay types, static and variable time delays, enabling the designers to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad6c554b70495930fcc2c303f4c783e8
https://hal.archives-ouvertes.fr/hal-00323013
https://hal.archives-ouvertes.fr/hal-00323013
Publikováno v:
ICECS
International Conference on Electronics, Circuits and Systems (ICECS)
International Conference on Electronics, Circuits and Systems (ICECS), Sep 2008, Saint Julians, Malta. pp.414-417
International Conference on Electronics, Circuits and Systems (ICECS)
International Conference on Electronics, Circuits and Systems (ICECS), Sep 2008, Saint Julians, Malta. pp.414-417
ISBN 978-1-4244-2182-4; International audience; Cryptographic devices have to be fully testable in order to ensure proper functionalities. On the other hand, security requirements restrict the use of some testing techniques, such as scan chains. Buil
Publikováno v:
14th IEEE International
Testing symposium (IOLT'08)
Testing symposium (IOLT'08), Jul 2008, Rhodes, Greece. pp.79-84, ⟨10.1109/IOLTS.2008.33⟩
IOLTS
Testing symposium (IOLT'08)
Testing symposium (IOLT'08), Jul 2008, Rhodes, Greece. pp.79-84, ⟨10.1109/IOLTS.2008.33⟩
IOLTS
ISBN : 978-0-7695-3264-6; International audience; Cryptographic devices are recently implemented with different countermeasures against side channel attacks and fault analysis. Moreover, some usual testing techniques, such as scan chains, are not all
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9cbe7c73c111e9c2302282013f329bdd
https://hal.archives-ouvertes.fr/hal-00319913
https://hal.archives-ouvertes.fr/hal-00319913
Autor:
Helmy, A., Pierre, Laurence
Publikováno v:
2ème Colloque du GdR SoC-SiP
2ème Colloque du GdR SoC-SiP, Jun 2008, Paris, France
2ème Colloque du GdR SoC-SiP, Jun 2008, Paris, France
Most of today's SoC's (Systems on Chips) are made of manufactured IP's interconnected through complex networks on chips (NoCs). We propose a generic NoC model, GeNoC, as a formal reference for the specification, formal verification, and simulation at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::42ef16f663f6716052e73bfb3df175c5
https://hal.archives-ouvertes.fr/hal-00323015
https://hal.archives-ouvertes.fr/hal-00323015
Premiers résultats sur l'utilisation d'ACL2 pour l'évaluation de la conséquence des erreurs logiques
Publikováno v:
2ème Colloque du GdR SoC-SiP
2ème Colloque du GdR SoC-SiP, Jun 2008, Paris, France
2ème Colloque du GdR SoC-SiP, Jun 2008, Paris, France
Nous nous proposons de développer de nouvelles méthodologies, basées sur une combinaison de techniques d'injection de fautes et de méthodes formelles, pour l'analyse de la robustesse d'un circuit décrit au niveau RTL, vis à vis des erreurs cré
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::95b2b5a4c9ecb87f320ff6763eef05f6
https://hal.archives-ouvertes.fr/hal-00323014
https://hal.archives-ouvertes.fr/hal-00323014
Publikováno v:
MEMOCODE
International Conference on Formal Methods and Models for Codesign (MEMOCODE'2008)
International Conference on Formal Methods and Models for Codesign (MEMOCODE'2008), Jun 2008, Anaheim,CA, United States. pp.75-76, ⟨10.1109/MEMCOD.2008.4547691⟩
International Conference on Formal Methods and Models for Codesign (MEMOCODE'2008)
International Conference on Formal Methods and Models for Codesign (MEMOCODE'2008), Jun 2008, Anaheim,CA, United States. pp.75-76, ⟨10.1109/MEMCOD.2008.4547691⟩
ISBN : 978-1-4244-2417-7; International audience; The Horus tool, based on formally proven correct methods, provides a unified support to assertion-based design, between the specification and the test phases. Given a set of logical and temporal prope
Publikováno v:
Electronic Symposium Digest of 13th IEEE European Test Symposium (ETS'08)
Electronic Symposium Digest of 13th IEEE European Test Symposium (ETS'08), May 2008, Verbania, Italy
Electronic Symposium Digest of 13th IEEE European Test Symposium (ETS'08), May 2008, Verbania, Italy
Poster; Cryptographic devices have to be fully testable in order to ensure proper functionalities. The possibility of using the ciphering circuit itself to perform self testing has been proposed. In this paper, we further explore this approach and we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c6982ec815b5140e595b20d5db0cee83
https://hal.archives-ouvertes.fr/hal-00319898
https://hal.archives-ouvertes.fr/hal-00319898
Autor:
Yahya, E., Renaudin, Marc
Publikováno v:
Design, Automation and Test in Europe Conference (DATE'08)
Design, Automation and Test in Europe Conference (DATE'08), Mar 2008, Munich, Germany
Design, Automation and Test in Europe Conference (DATE'08), Mar 2008, Munich, Germany
actes sur CD; International audience; Asynchronous circuits are increasingly proposed as an efficient circuit-level solution for Process Variability. Asynchronous circuits are self timed, which gives them the opportunity to be immune against all vari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::53ea51c8d1b9efa0d1bcbb5345bbecc1
https://hal.archives-ouvertes.fr/hal-00323011
https://hal.archives-ouvertes.fr/hal-00323011