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pro vyhledávání: '"P.O. Hansson"'
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Akademický článek
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Publikováno v:
Journal of Crystal Growth. :390-398
It has been experimentally found that it will be difficult to grow 300 mm or larger diameter crystals with similar quality as for 200 mm or smaller diameter crystals. This phenomenon can be understood within the frame of the Voronkov theory in which
Publikováno v:
Journal of Crystal Growth. 167:24-31
We investigate by transmission electron microscopy and atomic force microscopy the development of the growth surface profile of Si 0.97 Ge 0.03 Si (001) grown from metallic solution near thermodynamic equilibrium. We show that sinusoidal surface undu
Autor:
A. Gutjahr, I. Silier, N. Nagel, E. Czech, H. Raidt, E. Bauser, R. Köhler, B. Jenichen, M. Konuma, P.O. Hansson, Florian Banhart
Publikováno v:
Journal of Crystal Growth. 166:727-730
We have grown defect-free semiconductor-on-insulator (SOI) layers by liquid phase epitaxy. Defect-free Si layers grow laterally over SiO 2 by starting from seeding windows or ridge seeds on selectively oxide-masked (111) Si substrates. Growth is term
Autor:
E. Czech, E. Bauser, G. Cristiani, I. Silier, A. Gutjahr, M. Konuma, P.O. Hansson, Florian Banhart
Publikováno v:
Journal of Crystal Growth. 166:234-238
Two centrifugal techniques, I and II, have been applied to grow semiconductor layers in a rotating crucible. Technique I employs centrifugal forces to transport the solutions in the liquid phase epitaxial process. Layers of Si and SiGe grown on 100 m
Publikováno v:
Surface Science. :896-901
We investigate by atomic force microscopy the early growth stages of Ge 0.85 Si 0.15 grown by solution epitaxy on Si(001). The layers grow in the Stranski-Krastanov growth mode with facetted islands of pyramidal and, with further growth, truncated py
Publikováno v:
Journal of Crystal Growth. 141:363-370
We present low temperature cathodoluminescence (CL) studies of relaxed Ge x Si 1− x , selectively grown on a patterned Si (111) substrate by liquid phase epitaxy, using heteroepitaxial lateral overgrowth. In the spectrally resolved CL of the result
Publikováno v:
Surface Science. 314:L884-L888
The morphology and the electronic structure of heteroepitaxial germanium layers grown pseudomorphically by solution epitaxy on Si(001) has been investigated by scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). A significa
Publikováno v:
Solid State Phenomena. :41-46