Tapering of the interventricular septum can affect ultrasound shear wave elastography

Autor: Annette Caenen, Lana B. H. Keijzer, Hendrik J. Vos, A. Sabbadini, Martin D. Verweij, P.L.M.J. van Neer, N. de Jong

Publikováno v: JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA
The Journal of the Acoustical Society of America, 150(1)
Journal of the Acoustical Society of America, 150(1), 428-440. Acoustical Society of America

Shear wave elastography (SWE) has the potential to determine cardiac tissue stiffness from non-invasive shear wave speed measurements, important, e.g., for predicting heart failure. Previous studies showed that waves traveling in the interventricular

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d81f3451b01dd196d7440d1b5a1dc5d0
https://pure.eur.nl/en/publications/b8a17c9c-52ef-4f69-919d-054a373e0e33

Feasibility of 4 GHz half wavelength contact acoustic microscopy (HaWaCAM)

Autor: Mehmet Selman Tamer, M.H. van Es, K. Hatakeyama, D. Piras, P.L.M.J. van Neer, B.A.J. Quesson, M.C.J.M. van Riel

Publikováno v: 2021 IEEE International Ultrasonics Symposium (IUS).

Several methods are being researched to detect and characterize buried nanoscale structures in hard solid samples. The most common acoustic method is acoustic microscopy. An acoustic microscope is based on a single element transducer operating in pul

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f2bd5568ae6476ed583b4ba4430a401e
https://doi.org/10.1109/ius52206.2021.9593305

High resolution acoustic metrology by combining high GHZ frequency ultrasound and scanning probe microscopy

Autor: P.L.M.J. van Neer, D. Piras, Abbas Mohtashami, M.H. van Es, Laurent Fillinger, K. Hatakeyama, B.A.J. Quesson

Publikováno v: Proceedings Metrology, Inspection, and Process Control for Microlithography XXXIV, 20 March 2020, SPIE Event on Advanced Lithography, San Jose, CA, USA, 11325, 113250C-1-113250C-7
Robinson, J.C.Adan, O., Proceedings of SPIE-The International Society for Optical Engineering, Metrology, Inspection, and Process Control for Microlithography XXXIV 2020, 24 February 2020 through 27 February 2020

In order to extract ever more performance from semiconductor devices on the same device area, the semiconductor industry is moving towards device structures with increasingly complex material combinations and 3D geometries. To ensure cost effective f

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df07717fccee99dfde1d66c524583502
https://doi.org/10.1117/12.2552030

Optimization of acoustic coupling for bottom actuated scattering based subsurface scanning probe microscopy

Autor: Abbas Mohtashami, P.L.M.J. van Neer, Hamed Sadeghian, T. Duivenoorde, D. Piras, B.A.J. Quesson, M. Lans, M.H. van Es, K. Hatakeyama, M.C.J.M. van Riel

Publikováno v: Review of Scientific Instruments, 90(7):073705. American Institute of Physics
Review of Scientific Instruments, July, 90, 073705-1-073705-9
Review of Scientific Instruments, 90(7)

The characterization of buried nanoscale structures nondestructively is an important challenge in a number of applications, such as defect detection and metrology in the semiconductor industry. A promising technique is Subsurface Scanning Probe Micro

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b54b997ba88269a26184e46d565043d
http://www.scopus.com/inward/record.url?scp=85069229090&partnerID=8YFLogxK

Towards a calibration-free ultrasonic clamp-on flow meter: Pipe geometry measurements using matrix arrays

Autor: Michiel A. P. Pertijs, D. van Willigen, P.L.M.J. van Neer, Verweij, Jack Massaad, N. de Jong

Publikováno v: Proceedings of Meetings on Acoustics, 178th Meeting of the Acoustical Society of America, ASA 2019, 2 December 2019 through 6 December 2019

Current ultrasonic clamp-on flow meters are manually calibrated. This process is based on manual placement of two single-element transducers along a pipe wall. Due to the usually unknown pipe properties and inhomogeneities in the pipe geometry, the a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::460497abca0a38fd98a9c2818f39415e
http://resolver.tudelft.nl/uuid:5590af9f-f4d8-4dfc-a3f0-9ae6f74bbd64