Zobrazeno 1 - 10
of 14
pro vyhledávání: '"P.F. Cox"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 12:225-241
An intelligent partial Gauss-Seidel scheme (PGS) for general circuit simulation is described. This approach is a novel combination of direct solution using incomplete LU factorization, and iterative solution using Gauss-Seidel relaxation. The method
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 10:714-725
The improvement in computational throughput of VLSI circuit simulation is addressed. A high degree of natural parallelism exists in the circuit simulation problem; potentially a large number of processor can be used efficiently. Three distinct approa
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 8:1051-1064
To exploit time-domain latency in circuit simulation using direct methods, an accurate, computationally efficient model for slowly moving, dormant portions of the circuit is required. A new, implicit integration method, the overdetermined polynomial
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 7:645-658
Two techniques are presented for optimizing the parametric yield of digital MOS circuit blocks for VLSI designs. The first is based on quasi-Newton methods and utilizes the gradient of the yield. A novel technique for computing this yield gradient is
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 5:5-14
An integrated and efficient approach is developed for automated statistical circuit design. One major problem in statistical circuit design for MOS VLSI is the prohibitively expensive computational requirements. The objective is to find realistic, ac
Publikováno v:
IEEE Journal of Solid-State Circuits. 20:391-398
Large statistical variations are often found in the performance of VLSI circuits; as a result, only a fraction of the circuits manufactured may meet performance goals. An automated system has been developed to obtain the process statistical variation
Publikováno v:
1983 International Electron Devices Meeting.
Large statistical variations are often found in the performance of VLSI circuits; as a result, only a fraction of the circuits manufactured may meet performance goals. Interdie variations in length and width, oxide capitance, and flat band voltage ar
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