Zobrazeno 1 - 10 of 225 pro vyhledávání: '"P.E. Russell"'
3
Performance of Mixed Proppant Sizes
Autor: Darren Schmidt, P.E. Russell Rankin, Brandon Lewis Williams, Terry Palisch, John Kullman
Publikováno v: All Days.
Many well stimulation designs in the Bakken Petroleum system of the Williston Basin include hybrid treatments in which multiple fluid types and proppant types are incorporated into the pumping schedule. The industry at the present time is generally f
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e484f80a6ae511cc253535650b6d6e78
https://doi.org/10.2118/168629-ms
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4
A simple wave function interference model for the electron-density superstructures observed during scanning tunneling microscopy of perturbed graphite surfaces
Autor: P.E. Russell, G.M. Shedd
Publikováno v: Surface Science. 266:259-264
Scanning tunneling microscope images of graphite surfaces sometimes reveal patterns of increased and decreased electron density superimposed on the normal graphite image. Mizes and Foster [Science 244 (1989) 559] first suggested that these superstruc
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a81e935f97644339fdd095d4e4381ddc
https://doi.org/10.1016/0039-6028(92)91030-f
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5
Experimental electrical characterization of on-chip interconnects
Autor: B. Biswas, A. Glasser, P.E. Russell, Paul D. Franzon, Michael B. Steer, S. Lipa, D. Griffis
Publikováno v: Electrical Performance of Electronic Packaging.
This paper describes the transmission line and capacitance measurements made on a 0.25 micron test chip. Transmission lines were characterized to frequencies up to 20 GHz using a Hewlett Packard network analyzer and capacitances were determined using
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::478380a33cf821ee4bd56228c5d97659
https://doi.org/10.1109/epep.1997.634038
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6
A method for on-chip interconnect characterization
Autor: G.M. Shedd, A. Glaser, Paul D. Franzon, P.E. Russell, Michael B. Steer
Publikováno v: Proceedings of Electrical Performance of Electronic Packaging.
We present and novel method for the measurement of interconnect capacitance, atomic capacitance microscopy. We also present VLSI structures which allow correlation of ACM and traditional (VNA, TDR, direct capacitance) measurement techniques.
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c924f00831d6c1c3fc7dbe1dd87d9c40
https://doi.org/10.1109/epep.1995.524866
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8
Correlative STM, FESEM, and TEM studies of fibrillar structures in liquid crystalline polymers
Autor: L.C. Sawyer, P.E. Russell, R.T. Chen, M. G. Jamieson, Inga H. Musselman
Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 48:866-867
Hierarchical fibrillar structures have been reported to be present in liquid crystalline polymer (LCP) extrudates such as fibers and tapes. Using conventional scanning and transmission electron microscopy (SEM, TEM), the smallest fibrils were shown t
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::14cee7936b8c74b8a913070d935bae88
https://doi.org/10.1017/s0424820100177465
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