Výsledky vyhledávání - "P. Xiong‐Skiba"

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Replacing Lab Report Grading by Online Lab Quizzes

Autor: A. Kovalskiy, P. Xiong-Skiba, C. Little, S. Buckner

Publikováno v: The Physics Teacher. 58:55-57

This paper reports our work on replacing lab report grading by post-online lab quizzes using Desire2Learn (D2L, an online course management software), specifically, how we circumvent some of the limitations imposed by D2L and the outcomes.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bd21cec0b3ec53b63e024d2ffb4544a3
https://doi.org/10.1119/1.5141975

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Oxygen incorporation into GST phase-change memory matrix

Autor: Jeremy Trimble, Andriy Kovalskiy, Yong Gyu Choi, P. Xiong-Skiba, Yu. Chigirinsky, Sergey Kozyukhin, Himanshu Jain, Roman Golovchak, R. Pafchek

Publikováno v: Applied surface science. 2015. Vol. 332. P. 533-541

Structural changes in amorphous and crystallized GST-225 films induced by the reaction with oxygen are studied at different depth scales. The mechanism of interaction of the very top surface layers with oxygen is studied with low-energy ion scatterin

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3b1f35a3a0a3655a0aefae36ba7ba3f6
http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000526698

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Comparison of TiO2(110) Surfaces by XPS: Effects of UV Exposure, Electron Beam and Ion Beam Damage

Autor: M. H. Englehard, P. Xiong-Skiba, L.-Q. Wang, A. N. Shultz, D. R. Baer

Publikováno v: Surface Science Spectra. 5:193-202

Many studies have been carried out on rutile TiO2 since it was discovered to be a photocatalyst with relatively high efficiency for the decomposition of water. Surface defects are believed to play an important role in dissociation of absorbed water a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::886aa9976c4ed4f24a97b26fee24f594
https://doi.org/10.1116/1.1247839

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Load distribution in moving furniture

Autor: P. Xiong‐Skiba

Publikováno v: American Journal of Physics. 64:799-803

Static equilibrium conditions are applied to the case of moving a piece of furniture. Assume that two people are carrying a piece of furniture down a hill with a uniform speed. The load distribution on both people is found to be a function of the slo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::75973d0995fd180f5d00ed3c68d52335
https://doi.org/10.1119/1.18178

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Electron trapping mechanisms in an irradiated single crystal of quartz

Autor: P. Xiong-Skiba, David L. Carroll, D. L. Doering

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 11:2312-2316

Electron trapping states in the near surface region of electron irradiated single crystal quartz have been studied using thermionic and photon simulated electron emission. Electron bombardment at energies between 1 and 4 keV causes oxygen desorption

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bf8580ededd21acb56842eb611035080
https://doi.org/10.1116/1.578368

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Characterization of electron beam damage in oxidized silicon using thermally stimulated exoelectron emission

Autor: P. Xiong-Skiba, D. L. Doering, David L. Carroll

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:1549-1553

Silicon dioxide thin films grown on p‐type Si(111) wafers were exposed to electron beam irradiation ranging from 1 to 4 keV in energy. Subsequent heating of the samples resulted in thermally stimulated exoelectron emission (TSEE) with several peaks

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8213eb32209248466b354aadc71db9d4
https://doi.org/10.1116/1.576763

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Fracto‐emission during the interfacial failure of a metal–oxide‐semiconductor system: Au–SiO2–Si

Autor: P. Xiong‐Skiba, D. L. Doering, J. T. Dickinson, S. C. Langford

Publikováno v: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:2401-2406

Two fracto‐emission components (electron and photon emission) produced by the adhesive failure of gold films peeled in vacuum from oxidized silicon were measured for different oxide thicknesses. The Au adhesive strength was found to decrease with i

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4845fda7684308009719479092bfaae9
https://doi.org/10.1116/1.576705

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