Zobrazeno 1 - 10
of 38
pro vyhledávání: '"P. Willadson"'
Autor:
A. P. F. Flint
Publikováno v:
The Journal of Agricultural Science. 124:474-474
Autor:
Jeong-Sun Moon, Miroslav Micovic, P. Willadson, Paul Hashimoto, M. Antcliffe, C. McGuire, D. Wong, M. Hu
Publikováno v:
IEEE Electron Device Letters. 29:834-837
We report small- and large-signal performances of 140-nm gatelength field-plated GaN HEMTs at Ka-band frequencies, in which the GaN HEMTs were fabricated with n+ source contact ledge. The parasitic channel resistance is reduced by ~ 50%, whereas the
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Willadson, Peter
Publikováno v:
Australian Journal of Biological Sciences; Oct1977, Vol. 30 Issue 5, p411, 0p
Autor:
Zhou, Yuwei, Mi, Minhan, Yang, Mei, Han, Yutong, Wang, Pengfei, Chen, Yilin, Liu, Jielong, Gong, Can, Lu, Yiwei, Zhang, Meng, Zhu, Qing, Ma, Xiaohua, Hao, Yue
Publikováno v:
Applied Physics Letters; 2/7/2022, Vol. 120 Issue 6, p1-7, 7p
Autor:
Yaita, Junya, Fukuda, Koichi, Yamada, Atsushi, Iwasaki, Takuya, Nakaharai, Shu, Kotani, Junji
Publikováno v:
IEEE Electron Device Letters; Nov2021, Vol. 42 Issue 11, p1592-1595, 4p
Autor:
Romanczyk, Brian, Guidry, Matthew, Zheng, Xun, Shrestha, Pawana, Li, Haoran, Ahmadi, Elaheh, Keller, Stacia, Mishra, Umesh K.
Publikováno v:
Applied Physics Letters; 9/7/2021, Vol. 119 Issue 7, p1-6, 6p
Autor:
Moon, Jeong-Sun, Grabar, Bob, Wong, Joel, Chuong, Dao, Arkun, Erdem, Morales, Didiel Vazquez, Chen, Peter, Malek, Christopher, Fanning, David, Venkatesan, Nivedhita, Fay, Patrick
Publikováno v:
IEEE Electron Device Letters; Jun2021, Vol. 42 Issue 6, p796-799, 4p
Autor:
Gladysiewicz, M., Janicki, L., Kudrawiec, R., Misiewicz, J., Wosko, M., Paszkiewicz, R., Paszkiewicz, B., Tłaczała, M.
Publikováno v:
Journal of Applied Physics; 2014, Vol. 115 Issue 13, p133504-1-133504-6, 6p, 11 Graphs
Autor:
Green, Andrew J., Moser, Neil, Miller, Nicholas C., Liddy, Kyle J., Lindquist, Miles, Elliot, Michael, Gillespie, James K., Fitch, Robert C., Gilbert, Ryan, Walker, Dennis E., Werner, Elizabeth, Crespo, Antonio, Beam, Edward, Xie, Andy, Lee, Cathy, Cao, Yu, Chabak, Kelson D.
Publikováno v:
IEEE Electron Device Letters; Aug2020, Vol. 41 Issue 8, p1181-1184, 4p