Zobrazeno 1 - 10
of 65
pro vyhledávání: '"P. V. Nekrasov"'
Autor:
P. V. Nekrasov
Publikováno v:
Vestnik Permskogo Universiteta: Seriâ Geologiâ, Vol 23, Iss 1, Pp 10-22 (2024)
The article considers the features of the formation of karst-solifluction reservoirs in the eastern part of the Sokhsolokhskiy graben-shaped Trough, and traces the stages of their development. The spatial and genetic relationship of micro-components,
Externí odkaz:
https://doaj.org/article/a74b061f934140de89c782bf6e563fdb
Autor:
S. A. Boytsov, M. M. Loukianov, E. V. Platonova, V. M. Gorbunov, S. V. Romanchuk, O. A. Nazarova, O. A. Belova, E. A. Kravtsova, P. Ya. Dovgalevsky, N. V. Furman, A. A. Mironova, P. V. Dolotovskaya, A. V. Nekrasov, N. G. Puchkova, M. A. Abramova, E. N. Belova, V. G. Klyashtorny, A. D. Deev
Publikováno v:
Рациональная фармакотерапия в кардиологии, Vol 12, Iss 6, Pp 703-710 (2017)
Aim. To estimate an efficiency of influenza vaccination in patients with circulatory system diseases diseases (CSD) under 3-year follow-up in outpatient clinics.Methods. The efficiency of influenza vaccination was investigated in CSD patients followe
Externí odkaz:
https://doaj.org/article/860512e0e917427a90ad96d0ef3497da
Autor:
Sergei V. Nekrasov, Sergei S. Andreiko
Publikováno v:
Perm Journal of Petroleum and Mining Engineering, Vol 14, Iss 16, Pp 86-97 (2015)
Finite-element techniques in geomechanic calculations to assess strain-stress state in rock have shown insufficient flexibility towards varying geometry of computational schemes and necessity to set a large number of the unknown in solving space prob
Externí odkaz:
https://doaj.org/article/2c3587ba81a84b509dec2474a3e10d24
Autor:
V. V. Nekrasov, E. Makusheva
Publikováno v:
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, Vol XXXIX-B4, Pp 139-142 (2012)
“Canopus-V” satellite payload consists of two cameras – one of them panchromatic with 2.1 m GSD, another multispectral with 10 m GSD. Navigation system accuracy provides georeference accuracy about 70-80 m without using of control points. The p
Externí odkaz:
https://doaj.org/article/56e43430497d48fda1db6527e14f3830
Autor:
N V Bobkova, D N Lyabin, N I Medvinskaya, A N Samokhin, P V Nekrasov, I V Nesterova, I Y Aleksandrova, O G Tatarnikova, A G Bobylev, I M Vikhlyantsev, M S Kukharsky, A A Ustyugov, D N Polyakov, I A Eliseeva, D A Kretov, S G Guryanov, L P Ovchinnikov
Publikováno v:
PLoS ONE, Vol 10, Iss 9, p e0138867 (2015)
The Y-box binding protein 1 (YB-1) is a member of the family of DNA- and RNA binding proteins. It is involved in a wide variety of DNA/RNA-dependent events including cell proliferation and differentiation, stress response, and malignant cell transfor
Externí odkaz:
https://doaj.org/article/014f4f40e49b4531a889e55b466fe7d8
Autor:
D. V. Bobrovsky, V. A. Marfin, P. V. Nekrasov, I.O. Loskutov, N. D. Kravchenko, Anatoly A. Smolin, Andrey V. Yanenko
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation te
Publikováno v:
Russian Microelectronics. 46:171-179
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and impl
Autor:
O. A. Kalashnikov, P. V. Nekrasov, A. Yu. Nikiforov, V. A. Telets, V. V. Elesin, G. V. Chukov
Publikováno v:
Russian Microelectronics. 45:33-40
The analysis results of typical radiation faults of the system-on-chip have been presented. The specifics of digital, analog-to-digital (mixed), and microwave system-on-chip are considered. A set of the basic parameters-criteria for the radiation har
Autor:
Alexander Y. Nikiforov, O. A. Kalashnikov, Anastasija Ulanova, Dmitry V. Boychenko, P. V. Nekrasov, D. V. Bobrovsky
Publikováno v:
Facta universitatis - series: Electronics and Energetics. 28:153-164
Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional ?simple? ICs. The main difficulty is to organize i
Publikováno v:
2017 IEEE 30th International Conference on Microelectronics (MIEL).
This paper presents the system that allows SEFI modelling by means of injecting upsets in different microcontroller memory blocks, carrying out its functional control and detect the moment when SEFI occurs. Test setup was developed on the basis of Na