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Autor:
Nikolai A. Maleev, P. S. Kopjev, Zh. I. Alferov, I. A. Zamoryanskaya, V. T. Punin, V. M. Ustinov, S. G. Konnikov, M. A. Yagovkina, R. I. Ilkaev, Pavel N. Brunkov, A. A. Gutkin, A. V. Bobyl, Yu. G. Musikhin, D. A. Sakseev
Publikováno v:
Semiconductors. 40:687-690
The influence of gamma radiation on multilayer AlGaAs/InGaAs/GaAs transistor heterostructures has been studied by means of X-ray diffraction analysis and transmission electron microscopy. It was found that irradiation with doses exceeding ∼3 × 107