Zobrazeno 1 - 10
of 28
pro vyhledávání: '"P. Ruzakowski"'
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:998-1006
The optical properties of a mixed-metal oxide thin film from the Co3−x−yCrxFeyO4 family has been determined from combined analysis of ellipsometry, atomic force microscopy, and transmittance measurements. These types of films are useful as solar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df7f4b4391ae14bf3a8260affb32bc67
https://doi.org/10.1116/1.580794
https://doi.org/10.1116/1.580794
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 14:685-692
The optical constants of Co3O4films were determined by analyzing variable angle of incidence spectroscopic ellipsometry data and normal incidence transmittance data, between 3500 and 17 000 A. Absorption was taken to be nonzero for the soda–lime–
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05216c4705b55ef5b67a7d731646d3d8
https://doi.org/10.1116/1.580372
https://doi.org/10.1116/1.580372
Publikováno v:
Thin Solid Films. 253:326-332
Variable-angle spectroscopic ellipsometry is used for ex situ investigation of thin films deposited on substrates. Calculation of the thickness and optical properties of a number of films in a multilayer stack is possible, because a large amount of d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb3a5cd06dc2469ba1d2452d97bd0684
https://doi.org/10.1016/0040-6090(94)90342-5
https://doi.org/10.1016/0040-6090(94)90342-5
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 10:115-121
Thin films (∼300 A) of the superconductor YBa2Cu3O7−y were deposited on a Si 〈100〉 substrate by molecular beam epitaxy. The sample was then cleaved in two pieces and one of these was annealed at 860 °C for 3 h. X‐ray photoelectron spectros
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e559f31dd589180297b70d98d1f35dfc
https://doi.org/10.1116/1.578123
https://doi.org/10.1116/1.578123
Autor:
P. Ruzakowski-Athey, S. D. Walck
Publikováno v:
Microscopy and Microanalysis. 4:342-343
The analysis of Selected Area Diffraction (SAD) patterns that are collected from a single phase material having sufficient crystallites to provide continuous rings is relatively straightforward. However, when this condition is not met and there may b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71d94703dd89505230cc5ef3358320f7
https://doi.org/10.1017/s1431927600021838
https://doi.org/10.1017/s1431927600021838
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 14:3436
Variable angle of incidence spectroscopic ellipsometry, reflectance, and transmittance techniques were used to determine the optical constants of a fluorine doped tin oxide film deposited by chemical vapor deposition onto a hot soda‐lime‐silica g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f3b6fc96afe282220e9347dc8397c2e
https://doi.org/10.1116/1.588776
https://doi.org/10.1116/1.588776
Publikováno v:
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1996, Vol. 14 Issue 3, p685-692, 8p
Publikováno v:
Surface and Interface Analysis. 11:134-143
Spatially resolved optical micro-reflectometry in the visible region (from 400 nm to 800 nm) is used to study InSb substrates covered with SiOx (1 < x < 2) films of known thicknesses. Using optical constants (refractive index and extinction coefficie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12d024b284d6e05c3b43587352a8a164
https://doi.org/10.1002/sia.740110303
https://doi.org/10.1002/sia.740110303
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:1115-1119
Layers of known thicknesses of SiO1.1 and SiO2 deposited onto InSb substrates have been studied by optical microreflectometry, electron microprobe analysis, and x‐ray photoelectron spectroscopy. A model was used to calculate the resulting reflectan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8009f764be6a7e7da968aa9a004f50b
https://doi.org/10.1116/1.574812
https://doi.org/10.1116/1.574812
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 3:1380-1385
Optical microreflectometry is an analytical technique capable of nondestructively detecting the presence of thin films over diameters as small as 10 μm at atmospheric pressure and room temperature. The technique consists of measuring the percent ref
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dbb6794131be6d0ecbf51751e2b90a02
https://doi.org/10.1116/1.572783
https://doi.org/10.1116/1.572783