Výsledky vyhledávání - "P. R. Chalker"

Akademický článek

Atomic scale observation of threading dislocations in α-Ga2O3

Autor: Ross Mullen, Joseph W. Roberts, Paul R. Chalker, Rachel A. Oliver, Ben Hourahine, Fabien C. P. Massabuau

Publikováno v: AIP Advances, Vol 14, Iss 11, Pp 115018-115018-6 (2024)

This study presents a statistically significant investigation of threading dislocations in α-Ga2O3 using high-resolution transmission electron microscopy. All the dislocations, observed end on, exhibit a projected Burgers vector be=13⟨11̄00⟩, w

Externí odkaz: https://doaj.org/article/82f59929beec4bc38ebbd61f5953f2e7

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Akademický článek

Band alignments at Ga2O3 heterojunction interfaces with Si and Ge

Autor: J. T. Gibbon, L. Jones, J. W. Roberts, M. Althobaiti, P. R. Chalker, Ivona Z. Mitrovic, V. R. Dhanak

Publikováno v: AIP Advances, Vol 8, Iss 6, Pp 065011-065011-7 (2018)

Amorphous Ga2O3 thin films were deposited on p-type (111) and (100) surfaces of silicon and (100) germanium by atomic layer deposition (ALD). X-ray photoelectron spectroscopy (XPS) was used to investigate the band alignments at the interfaces using t

Externí odkaz: https://doaj.org/article/10987ab982fc486b9fb5456b8af23d0a

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Akademický článek

Vacuum ultraviolet photochemical selective area atomic layer deposition of Al2O3 dielectrics

Autor: P. R. Chalker, P. A. Marshall, K. Dawson, I. F. Brunell, C. J. Sutcliffe, R. J. Potter

Publikováno v: AIP Advances, Vol 5, Iss 1, Pp 017115-017115-7 (2015)

We report the photochemical atomic layer deposition of Al2O3 thin films and the use of this process to achieve area-selective film deposition. A shuttered vacuum ultraviolet (VUV) light source is used to excite molecular oxygen and trimethyl aluminum

Externí odkaz: https://doaj.org/article/ead30dd1be3441aaa957de941aac84ef

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Extrinsic and Intrinsic Frequency Dispersion of High-k Materials in Capacitance-Voltage Measurements

Autor: S. Taylor, P. R. Chalker, P. Taechakumput, M. Werner, C. Zhao, C. Z. Zhao, J. Tao

Publikováno v: Materials, Vol 5, Iss 6, Pp 1005-1032 (2012)

In capacitance-voltage (C-V) measurements, frequency dispersion in high-k dielectrics is often observed. The frequency dependence of the dielectric constant (k-value), that is the intrinsic frequency dispersion, could not be assessed before suppressi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doajarticles::2e54d928d02b76619795f8db98469bbf
http://www.mdpi.com/1996-1944/5/6/1005

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Characterisation of Diamond and Diamond-Like Films

Autor: P. R. Chalker

Publikováno v: Diamond and Diamond-like Films and Coatings ISBN: 9781468459692

The development of both CVD and PVD technologies for the deposition of diamond and diamond-like carbon (DLC) films has provided a wide range of materials for potential applications in optical, electronic and tribological fields. The range of material

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::689c761c0c8607e4f0bfd622111f950d
https://doi.org/10.1007/978-1-4684-5967-8_7

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Characterisation of coatings and interfaces

Autor: P. R. Chalker

Publikováno v: Advanced Surface Coatings: a Handbook of Surface Engineering ISBN: 9789401053525
Advanced Surface Coatings: a Handbook of Surface Engineering

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2a9270a5e3a3f0c1d5fad4b901051e13
https://doi.org/10.1007/978-94-011-3040-0_11

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