Zobrazeno 1 - 10
of 24
pro vyhledávání: '"P. R. Bressler"'
Autor:
Nabil Mehta, M.D., Thomas Alter, M.S., Edward C. Beck, M.D., M.P.H., Jourdan M. Cancienne, M.D., Leah R. Bressler, P.A., Joseph N. Liu, M.D., Shane J. Nho, M.D., M.S.
Publikováno v:
Arthroscopy Techniques, Vol 8, Iss 7, Pp e675-e678 (2019)
Hamstring strains account for 25% to 30% of all muscle strains and are an exceedingly common injury in the athletic population. Although proximal hamstring avulsion injuries occur less commonly than strains at the myotendinous junction, they are more
Externí odkaz:
https://doaj.org/article/7c58f24a7bfd47319b14ad747265aabe
Autor:
Benjamin D. Kuhns, M.S., Brandon J. Erickson, M.D., Leah R. Bressler, M.S., P.A-C., Sara M. Sarmast, M.M.S., P.A-C., Shane J. Nho, M.D., M.S.
Publikováno v:
Arthroscopy Techniques, Vol 4, Iss 6, Pp e747-e750 (2015)
Hip distraction is necessary for safe arthroscopic entry into the hip joint. Achieving sufficient distraction is difficult in exceedingly tall patients (>190.5 cm) because of size limitations of currently available hip distraction systems. Inadequate
Externí odkaz:
https://doaj.org/article/e47075a04d1c47c8a79fe093db6e4ab7
Autor:
Wolfgang Braun, Sunggook Park, Thorsten U. Kampen, P. R. Bressler, Dietrich R. T. Zahn, T. Kachel
Publikováno v:
Applied Surface Science. 190:376-381
The interaction of Ag and In with a thin film of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) was studied by near-edge X-ray absorption fine structure (NEXAFS). Upon Ag deposition on a PTCDA film of 20 nm thickness the relative intensities an
Publikováno v:
Diamond and Related Materials. 11:8-15
The change in the structure of tetrahedral amorphous carbon (ta-C) films by nitrogen incorporation is studied by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and electron energy-loss spectroscopy (EELS). NEXAFS spectroscopy can be
Autor:
José Sanz, and J. F. Trigo, Agustín R. González-Elipe, P. R. Bressler, Leonardo Soriano, C. Quirós, Gonzalo García Fuentes
Publikováno v:
Langmuir. 16:7066-7069
The electronic structure of the TiO2−SiO2 interface has been investigated using X-ray absorption spectroscopy (XAS). TiO2 overlayers have been grown on two substrates, amorphous SiO2 and highly oriented pyrolytic graphite (for comparison), by evapo
Publikováno v:
Scopus-Elsevier
The phase composition and microcrystalline structure of thin gallium nitride (GaN) grown by nitridation of (001) oriented gallium arsenide (GaAs) was investigated by near edge x-ray absorption fine structure (NEXAFS) spectroscopy. The GaN layer was g
Autor:
Ch. Jung, D. Eich, Rainer H. Fink, Clemens Heske, U. Winkler, P. R. Bressler, Eberhard Umbach
Publikováno v:
Physical Review B. 56:13335-13345
The interface formation of Zn/CdTe(100) has been investigated using synchrotron and Mg $K\ensuremath{\alpha}$ x-ray photoelectron spectroscopy. We identify five distinct phases of the interface formation process, including the passivation of surface
Publikováno v:
Physical Review B. 56:2085-2093
Autor:
Rainer H. Fink, P. R. Bressler, Clemens Heske, Eberhard Umbach, C. Hellwig, U. Winkler, Georg Held, Ch. Jung
Publikováno v:
Physical Review B. 56:2070-2078
Autor:
Ch. Jung, P. R. Bressler
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 78:503-506
Angle resolved photoemission spectroscopy with synchrotron radiation was used to study the valence band structure of InSb (100). Normal emission energy distribution curves exhibit direct transitions from the valence band maximum Γ8 at the Γ-point o