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pro vyhledávání: '"P. N. Granell"'
Autor:
María Cecilia Fuertes, Eduardo D. Martínez, L. Granja, Pablo Levy, P. N. Granell, A. Zelcer, G. J. A. A. Soler Illia, M. Linares Moreau, Federico Golmar
Conductive-tip atomic force microscopy (CAFM) was used to explore the effects of high electric fields on silver nanoparticle (NP) arrays embedded inside the pores of mesoporous TiO2 thin films (MTF). A controlled local modification of the distributio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7927038550e5a7488123b06f159162b5
https://pubs.acs.org/doi/10.1021/acs.jpcc.8b11217
https://pubs.acs.org/doi/10.1021/acs.jpcc.8b11217
