Zobrazeno 1 - 10
of 82
pro vyhledávání: '"P. Mazarov"'
Autor:
Hollenbach, M., Klingner, N., Mazarov, P., Pilz, W., Nadzeyka, A., Mayer, F., Abrosimov, N. V., Bischoff, L., Hlawacek, G., Helm, M., Astakhov, G. V.
Carbon implantation at the nanoscale is highly desired for the engineering of defect-based qubits in a variety of materials, including silicon, diamond, SiC and hBN. However, the lack of focused carbon ion beams does not allow for the full disclosure
Externí odkaz:
http://arxiv.org/abs/2404.19592
Autor:
Höflich, Katja, Hobler, Gerhard, Allen, Frances I., Wirtz, Tom, Rius, Gemma, McElwee-White, Lisa, Krasheninnikov, Arkady V., Schmidt, Matthias, Utke, Ivo, Klingner, Nico, Osenberg, Markus, Córdoba, Rosa, Djurabekova, Flyura, Manke, Ingo, Moll, Philip, Manoccio, Mariachiara, De Teresa, José Marıa, Bischoff, Lothar, Michler, Johann, De Castro, Olivier, Delobbe, Anne, Dunne, Peter, Dobrovolskiy, Oleksandr V., Frese, Natalie, Gölzhäuser, Armin, Mazarov, Paul, Koelle, Dieter, Möller, Wolfhard, Pérez-Murano, Francesc, Philipp, Patrick, Vollnhals, Florian, Hlawacek, Gregor
The focused ion beam (FIB) is a powerful tool for the fabrication, modification and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor industry,
Externí odkaz:
http://arxiv.org/abs/2305.19631
Focused Ion Beam (FIB) processing has been established as a well-suited and promising technique in R&D in nearly all fields of nanotechnology for patterning and prototyping on the micro and nanometer scale and below. Among other concepts, liquid meta
Externí odkaz:
http://arxiv.org/abs/2004.12722
Autor:
Kukharchyk, Nadezhda, Neumann, Ronna, Mazarov, Swetlana, Bushev, Pavel, Wieck, Andreas, Mazarov, Paul
We present a new YAuSi Liquid Metal Alloy Ion Source (LMAIS), generating focused ion beams of yttrium ions, and its prospective applications for nanofabrication, sample preparation, lithographic and implantation processes. Working parameters of the A
Externí odkaz:
http://arxiv.org/abs/1610.07166
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1742-1749 (2020)
While the application of focused ion beam (FIB) techniques has become a well-established technique in research and development for patterning and prototyping on the nanometer scale, there is still a large underused potential with respect to the usage
Externí odkaz:
https://doaj.org/article/d73b8a7ab9a74a96ac524d3067633dc3
Publikováno v:
Известия высших учебных заведений: Проблемы энергетики, Vol 21, Iss 6, Pp 39-50 (2020)
The paper presents the results of wind monitoring carried out in order to confirm the feasibility of building a wind farm in the Republic of Tatarstan. The task of wind monitoring is to determine and study the dynamics of the average annual wind regi
Externí odkaz:
https://doaj.org/article/4d774c76ad72409fbe0a4931c69514e5
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Akademický článek
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Publikováno v:
International Journal of Engineering Business Management, Vol 12 (2020)
Lean Management builds the basis for efficient production systems for many industrial companies. However, lots of potentials of Lean Management have been lifted and information and communication technologies in the context of digitalization and cyber
Externí odkaz:
https://doaj.org/article/c1e64160b6914e82bd69a00783d53a48