Zobrazeno 1 - 10
of 39
pro vyhledávání: '"P. L. Trouilloud"'
Publikováno v:
AIP Advances, Vol 9, Iss 1, Pp 015002-015002-6 (2019)
Barrier interface condition is critical for spin-polarized tunneling and spin-transfer torque switching in CoFeB∣MgO∣CoFeB-based magnetic tunnel junctions. The differential tunnel conductance gV contains information on CoFeB’s magnetic properti
Externí odkaz:
https://doaj.org/article/64c2a5127d86494b8c7932b21529d23c
Autor:
G. Hu, C. Safranski, J. Z. Sun, P. Hashemi, S. L. Brown, J. Bruley, L. Buzi, C. P. D'Emic, E. Galligan, M. G. Gottwald, O. Gunawan, J. Lee, S. Karimeddiny, P. L. Trouilloud, D. C. Worledge
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Autor:
D. C. Worledge, C. Safranski, G. Hu, J. Z. Sun, P. Hashemi, S. L. Brown, L. Buzi, C. P. D'Emic, M. G. Gottwald, O. Gunawan, H. Jung, S. Karimeddiny, J. Kim, P. L. Trouilloud
Publikováno v:
2022 IEEE 33rd Magnetic Recording Conference (TMRC).
Autor:
C. Safranski, G. Hu, J. Z. Sun, P. Hashemi, S. L. Brown, L. Buzi, C. P. D'Emic, E. R. J. Edwards, E. Galligan, M. G. Gottwald, O. Gunawan, S. Karimeddiny, H. Jung, J. Kim, K. Latzko, P. L. Trouilloud, S. Zare, D. C. Worledge
Publikováno v:
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).
Autor:
G. Hu, G. Lauer, J. Z. Sun, P. Hashemi, C. Safranski, S. L. Brown, L. Buzi, E. R. J. Edwards, C. P. D'Emic, E. Galligan, M. G. Gottwald, O. Gunawan, H. Jung, J. Kim, K. Latzko, J. J. Nowak, P. L. Trouilloud, S. Zare, D. C. Worledge
Publikováno v:
2021 IEEE International Electron Devices Meeting (IEDM).
Autor:
Michael F. Lofaro, Anthony J. Annunziata, Daniel C. Edelstein, Michael C. Gaidis, Dirk Pfeiffer, Adam M. Pyzna, Eugene J. O'Sullivan, Nathan P. Marchack, Eric A. Joseph, Yu Zhu, Armand Galan, P. L. Trouilloud, Jemima Gonsalves, S. Holmes
Publikováno v:
ECS Transactions. 69:127-137
Recent developments in new switching methods, such as spin transfer torque and temperature-assisted switching (TAS), have greatly increased interest in MRAM. However, MRAM fabrication is challenging due to the lack of magnetic materials processing ex
Autor:
C. Kothandaraman, E. J. O'Sullivan, J. Harms, Yohan Kim, S. Brown, P. L. Trouilloud, Anthony J. Annunziata, W. Chen, J. Z. Sun, Y. Zhu, Nathan P. Marchack, S. Murthy, J.H. Park, R. P. Robertazzi, D. C. Worledge, G. Hu, J. H. Lee, G. Lauer, M. Reuter, Janusz J. Nowak
Publikováno v:
VLSI-DAT
To achieve low write current in high density Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) arrays, it is important to understand and co-optimize the different kinds of device switching currents, governed by different materials paramet
Autor:
E. J. O'Sullivan, C Camagong, J. J. Nowak, M Hopstaken, E. A. Galligan, P. L. Trouilloud, R. Kothandaraman, Y. Luo, M. Krishnan
Publikováno v:
ECS Meeting Abstracts. :916-916
After some early successes with electroless Cu for printed circuit board wiring (1), and the use of electroless Co-based magnetic films over non-magnetic electroless nickel films on rigid Al disks in the magnetic storage industry, for several years,
Autor:
M. Gajek, Eugene J. O'Sullivan, R. P. Robertazzi, Guohan Hu, Jonathan Z. Sun, D. W. Abraham, Daniel C. Worledge, Janusz J. Nowak, Michael C. Gaidis, Stephen L. Brown, P. L. Trouilloud, William J. Gallagher
Publikováno v:
ECS Transactions. 58:117-125
Spin-torque Magnetoresistive Random Access Memory (ST-MRAM) is the subject of intense investigation since it extends MRAM technology to densities beyond those achieved with the earlier field-switched MRAM technology. This paper reviews recent develop
Autor:
Y. Zhu, D. C. Worledge, Anthony J. Annunziata, J. Z. Sun, J. Harms, G. Lauer, Janusz J. Nowak, R. P. Robertazzi, S. Brown, W. Chen, M. Reuter, Nathan P. Marchack, E. J. O'Sullivan, P. L. Trouilloud, G. Hu, J.H. Park, J. H. Lee, Luqiao Liu, S. Murthy, Yohan Kim
Publikováno v:
2015 IEEE International Electron Devices Meeting (IEDM).
We report switching performance of perpendicularly magnetized Spin-Transfer Torque MRAM (STT-MRAM) devices with double tunnel barriers and two reference layers. We show that stacks with double tunnel barriers improve the switching efficiency (Eb/Ic0)