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of 4
pro vyhledávání: '"P. K. Den Hartog"'
There are 236 vacuum chambers and 23 special insertion device vacuum chambers installed at the Advanced Photon Source storage ring. Each is fabricated from an aluminum extrusion, followed by machining and welding. The standard vacuum chambers have a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c9057429d9a41aaa5d90667a176dcfa
http://cds.cern.ch/record/555713
http://cds.cern.ch/record/555713
Autor:
S. V. Milton, E. Gluskin, S. G. Biedron, R. J. Dejus, P. K. Den Hartog, J. N. Galayda, K.-J. Kim, J. W. Lewellen, E. R. Moog, V. Sajaev, N. S. Sereno, G. Travish, N. A. Vinokurov, N. D. Arnold, C. Benson, W. Berg, J. A. Biggs, M. Borland, J. A. Carwardine, Y.-C. Chae, G. Decker, B. N. Deriy, M. J. Erdmann, H. Friedsam, C. Gold, A. E. Grelick, M. W. Hahne, K. C. Harkay, Z. Huang, E. S. Lessner, R. M. Lill, A. H. Lumpkin, O. A. Makarov, G. M. Markovich, D. Meyer, A. Nassiri, J. R. Noonan, S. J. Pasky, G. Pile, T. L. Smith, R. Soliday, B. J. Tieman, E. M. Trakhtenberg, G. F. Trento, I. B. Vasserman, D. R. Walters, X. J. Wang, G. Wiemerslage, S. Xu, B.-X. Yang
Publikováno v:
Physical review letters. 85(5)
Experimental evidence for self-amplified spontaneous emission (SASE) at 530 nm is reported. The measurements were made at the low-energy undulator test line facility at the Advanced Photon Source, Argonne National Laboratory. The experimental setup a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bff1ec07dd38842c41345e0207b06938
https://pubmed.ncbi.nlm.nih.gov/10991456
https://pubmed.ncbi.nlm.nih.gov/10991456
Publikováno v:
AIP Conference Proceedings.
Dose measurements made on and around the insertion devices (IDs) at the Advanced Photon Source are reported. Attempts are made to compare these dose rates to dose rates that have been reported to cause radiation-induced demagnetization, but compariso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7f5725c80fab7020e45d79172f87b93
https://doi.org/10.1063/1.54602
https://doi.org/10.1063/1.54602
Publikováno v:
Journal of Chemical Information and Modeling; September 2002, Vol. 42 Issue: 5 p1104-1111, 8p