Zobrazeno 1 - 10
of 16
pro vyhledávání: '"P. J. Orders"'
Autor:
F. Grainger, I. K. Varga, G. Shen, P. Capper, P. J. Orders, M. A. Folkard, I. G. Gale, V. Kumar, K. Fueloop, D. Carr, R. H. Hartley, S. Barton, B. A. Johnson, D. Dutton, T. A. Steele
Publikováno v:
Journal of Electronic Materials. 25:1521-1526
We have found phase modulated ellipsometry (PME) to be a sensitive analytical technique capable of providing real time information on composition, epilayer thickness, growth rate, interdiffusion and surface roughness. To fully exploit the benefits of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c73ff14750b83a9f50edfd368287db3
https://doi.org/10.1007/bf02655393
https://doi.org/10.1007/bf02655393
Autor:
P. J. Orders, I. K. Varga, G. Shen, T. A. Steele, M. A. Folkard, H. Buskes, B. A. Johnson, K. Fueloep, V. Kumar, R. H. Hartley, M. Gal, D. Carr, D. Rees
Publikováno v:
Journal of Electronic Materials. 22:1097-1102
Phase modulated ellipsometric data recorded during molecular beam epitaxial growth of CdTe/HgTe and CdTe/ZnTe superlattices on (100) and (211)B oriented Cd0.96Zn0.04Te and GaAs substrates are presented. The measurements provide a continuous monitor o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9567dbfef8bb067132fd99b90048c4f6
https://doi.org/10.1007/bf02817531
https://doi.org/10.1007/bf02817531
Autor:
R. H. Hartley, J. B. Lee, D. Rees, H. Buskes, I. K. Varga, V. Kumar, P. J. Orders, M. A. Folkard, T. A. Steele, D. Carr, G. Shen
Publikováno v:
Journal of Crystal Growth. 117:166-170
Ellipsometry is a sensitive non-destructive analytical technique well suited to the MBE growth process. We report its use in real time to control CdHgTe alloy composition, to control growth of superlattice structures, and to provide a measure of grow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7755e87ab1231dad226fc4b5d2cf890a
https://doi.org/10.1016/0022-0248(92)90738-5
https://doi.org/10.1016/0022-0248(92)90738-5
Autor:
P. J. Orders, F. U. Hillebrecht, J.D. Riley, G. Kemister, Lothar Ley, R.C.G. Leckey, Anton P. J. Stampfl, Brian F. Usher
Publikováno v:
Physica Scripta. 41:617-620
Angle resolved photoemission measurements covering the photon range 10.0 to 50.0 eV have been maade on MBE grown In0.27Ga0.73As(100) layers using the Berlin synchrotron radiation source BESSY. The use of a toroidal energy analyser has enabled us to a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::879362095324d44aa871a3d3b98ac66a
https://doi.org/10.1088/0031-8949/41/4/053
https://doi.org/10.1088/0031-8949/41/4/053
Autor:
V. Kumar, M. A. Folkard, D. Carr, I. K. Varga, J. B. Lee, R. H. Hartley, T. A. Steele, H. Buskes, P. J. Orders, D. Rees, G. Shen
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 10:1410
Ellipsometry is a sensitive nondestructive analytical technique well suited to the molecular‐beam epitaxy (MBE) growth process. We report its use in real time to control composition, growth rates, interdiffusion, and growth related surface defects
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ea95a4d9b978478f8b55bd44bd62132
https://doi.org/10.1116/1.585877
https://doi.org/10.1116/1.585877
Publikováno v:
Solid State Communications. 50:315-319
The temperature dependence of X-ray photoelectron diffraction (XPD) affects in azimuthal distributions of Cu 2p 3 2 core level intensities from a clean copper (001) single crystal has been measured in the range from ambient to 1010 K and for polar an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86391b02252d4ff05f350801d0ca4437
https://doi.org/10.1016/0038-1098(84)90376-4
https://doi.org/10.1016/0038-1098(84)90376-4
Autor:
P. J. Orders, Charles S. Fadley
Publikováno v:
Physical Review B. 27:781-798
The results of single-scattering cluster (SSC) calculations of normal photoelectron diffraction (NPD) from the S $1s$ level in $c(2\ifmmode\times\else\texttimes\fi{}2)\mathrm{S}$ on Ni(001) are compared with multiple-scattering (MS) calculations by T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b6d12441163577afee1a01cfba23f17
https://doi.org/10.1103/physrevb.27.781
https://doi.org/10.1103/physrevb.27.781
Publikováno v:
Journal of Applied Physics. 62:3898-3901
Photoluminescence in strained InxGa1−xAs‐GaAs single heterostructures, grown by molecular‐beam epitaxy, is studied, and the critical layer thickness is determined for a range of In mole fractions. The critical thicknesses are compared with simi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47446d742d18d113607b427884724d93
https://doi.org/10.1063/1.339236
https://doi.org/10.1063/1.339236
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 2:1333-1338
The polar and azimuthal angular dependences of core‐level x‐ray photoelectron peak intensities from c(2×2)S on Ni(001) are studied in detail in order to determine the accuracy of such measurements for quantitative analyses of such adsorbate/subs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ad9c8a846df99bd2315e47ed8b9c6b5
https://doi.org/10.1116/1.572404
https://doi.org/10.1116/1.572404
Publikováno v:
Physical Review B. 30:1838-1843
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d3ca9fec1527ce0d1f4d884850da8ec
https://doi.org/10.1103/physrevb.30.1838
https://doi.org/10.1103/physrevb.30.1838