Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2 x 2)-N/Cu(100)

Autor: S. D'Addato(1, F. Borgatti(3), R. Felici(4), P. Finetti(5)

Publikováno v: Surface science 606 (2012): 813–819. doi:10.1016/j.susc.2012.01.015
info:cnr-pdr/source/autori:S. D'Addato(1,2), F. Borgatti(3), R. Felici(4), P. Finetti(5)/titolo:Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2 x 2)-N%2FCu(100)/doi:10.1016%2Fj.susc.2012.01.015/rivista:Surface science/anno:2012/pagina_da:813/pagina_a:819/intervallo_pagine:813–819/volume:606

We report the results of a Surface X-Ray Diffraction (SXRD) study of Fe nanostructured films deposited on c(2 x 2)-N/Cu(100) at room temperature (RT), with Fe coverage theta(Fe)= 0.5 ML and theta(Fe) = 1 ML. The c( 2 x 2)-N/Cu(100) surface is an exam

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0301af376db69cf3c28ee4a6dec49485
https://publications.cnr.it/doc/190749