Zobrazeno 1 - 10
of 233
pro vyhledávání: '"P. Andrle"'
Publikováno v:
Česká Stomatologie a Praktické Zubní Lékařství, Vol 116, Iss 3, Pp 57-65 (2016)
Aim of the study: Adenoid cystic carcinoma (AdCC) is the second most common salivary gland cancer. This malignant tumor is characterized by its slow growth and in spite of the fact that it has a histological low - grade appearance, a prolonged clinic
Externí odkaz:
https://doaj.org/article/13706ef8c6894dbc9a5a9cb9da92e3cf
Publikováno v:
Česká Stomatologie a Praktické Zubní Lékařství, Vol 113, Iss 6, Pp 137-141 (2013)
Introduction: Intraosseous mucoepidermoid carcinoma is a relatively rare variant of the histologically identical malignant tumor affecting salivary glands. It is a recently described separate nosological entity with a clearly defined histopathologica
Externí odkaz:
https://doaj.org/article/8cee2ca423754d9593993765dfb74fa7
Publikováno v:
Česká Stomatologie a Praktické Zubní Lékařství, Vol 113, Iss 2, Pp 42-51 (2013)
Aim of the study: To characterize the current population of patients with squamous cell carcinoma of the lip with focus on the biological behavior and prognosis of these tumors. To evaluate the lip cancer treatment at the department of maxillofacial
Externí odkaz:
https://doaj.org/article/e0bc415c8a094dadbb476a915e74590a
Publikováno v:
Česká Stomatologie a Praktické Zubní Lékařství, Vol 112, Iss 1, Pp 4-13 (2012)
Objectives: Osteonecrosis of the jaws is a rare side effect of bisphosphonate therapy, occurring especially in oncological patients but also in patients with metabolic bone diseases. Because it is a relatively recently described disease (year 2003),
Externí odkaz:
https://doaj.org/article/d9df95e26df0438180305ef4552340d1
Publikováno v:
Adv. Theory Simul. 5, 2200112 (2022)
Parameter reconstructions are indispensable in metrology. Here, the objective is to to explain $K$ experimental measurements by fitting to them a parameterized model of the measurement process. The model parameters are regularly determined by least-s
Externí odkaz:
http://arxiv.org/abs/2202.11559
Autor:
Andrle, Anna, Hönicke, Philipp, Schneider, Philipp, Kayser, Yves, Hammerschmidt, Martin, Burger, Sven, Scholze, Frank, Beckhoff, Burkhard, Soltwisch, Victor
Publikováno v:
Proc. SPIE 11057, 110570M (2019)
For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Using the grazing incidence X-ray fluoresence technique, which is taking
Externí odkaz:
http://arxiv.org/abs/2104.13749
Autor:
Saadeh, Qais, Naujok, Philipp, Philipsen, Vicky, Hönicke, Philipp, Laubis, Christian, Buchholz, Christian, Andrle, Anna, Stadelhoff, Christian, Mentzel, Heiko, Schönstedt, Anja, Soltwisch, Victor, Scholze, Frank
The optical constants of ruthenium in the spectral range 8 nm to 23.75 nm with their corresponding uncertainties are derived from the reflectance of a sputtered ruthenium thin film in the Extreme Ultraviolet (EUV) spectral range measured using monoch
Externí odkaz:
http://arxiv.org/abs/2103.11868
Autor:
Andrle, Anna, Hönicke, Philipp, Gwalt, Grzegorz, Schneider, Philipp-Immanuel, Kayser, Yves, Siewert, Frank, Soltwisch, Victor
The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic circuits. Modern transistor architectures for e.g. FinFETs are realize
Externí odkaz:
http://arxiv.org/abs/2102.06600
Autor:
Andrle, Anna, Farchmin, Nando, Hagemann, Paul, Heidenreich, Sebastian, Soltwisch, Victor, Steidl, Gabriele
Grazing incidence X-ray fluorescence is a non-destructive technique for analyzing the geometry and compositional parameters of nanostructures appearing e.g. in computer chips. In this paper, we propose to reconstruct the posterior parameter distribut
Externí odkaz:
http://arxiv.org/abs/2102.03189
Autor:
Andrle, A., Hönicke, P., Vinson, J., Quintanilha, R., Saadeh, Q., Heidenreich, S., Scholze, F., Soltwisch, V.
The refractive index of a y-cut SiO$_2$ crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. Due to the anisotropy of the crystal structure in the (100) and (001)
Externí odkaz:
http://arxiv.org/abs/2010.09436