Zobrazeno 1 - 10
of 10
pro vyhledávání: '"P. Anders Ingemarsson"'
Autor:
Scott R. Walker, Mikael Östling, P. Anders Ingemarsson, Mohamed El Bouanani, Leif Persson, Erik Johanson, Carina Zaring, Ian F. Bubb, Peter N. Johnston, Nick Dytlewski, Margaretha Andersson, Sture Hogmark, Mikael Hult, David D. Cohen, Harry J. Whitlow, Nils Lundberg
Publikováno v:
Mikrochimica Acta. 120:171-181
Recoil Spectrometry covers a group of techniques that are very similar to the well known Rutherford backscattering Spectrometry technique, but with the important difference that one measures the recoiling target atom rather than the projectile ion. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a531ba1e6e11a620d1928e2125c96fe
https://doi.org/10.1007/bf01244430
https://doi.org/10.1007/bf01244430
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 63:445-450
Mass and energy dispersive recoil spectrometry has been employed to semi-quantitatively characterize changes in the tribo-surfaces of bearing steel subjected to lubricated sliding wear in two model oils containing zinc dialkydithiophosphate (ZDDP) an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::415ba8423f17365cae2c930d0a90f996
https://doi.org/10.1016/0168-583x(92)95217-f
https://doi.org/10.1016/0168-583x(92)95217-f
Autor:
P. Anders Ingemarsson
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 44:437-444
The ability of energetic ion beams to enhance the strength of thin film interfaces is a well-established phenomenon. Both the adhesion as such and its ability to improve depend on the nature of the film and substrate. In the case of metal-Teflon inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e939a32abe4d8f172c683caee22b6e0b
https://doi.org/10.1016/0168-583x(90)90005-f
https://doi.org/10.1016/0168-583x(90)90005-f
Autor:
P. Anders Ingemarsson
Publikováno v:
Metallized Plastics 2 ISBN: 9781489907370
Ion beams can be used to enhance the adhesion of metal films to polymer substrates. Typical doses range from 1011 to 1016/cm2 depending on materials, ion species, ion energies, etc. Recent progress in the understanding of radiation induced chemical a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ad73c95012ed153901317d6ab3235bf
https://doi.org/10.1007/978-1-4899-0735-6_28
https://doi.org/10.1007/978-1-4899-0735-6_28
Publikováno v:
Journal of Applied Physics. 66:3548-3553
The effect of MeV ion beams incident on Teflon surfaces was studied by x‐ray photoelectron spectroscopy (XPS). Irradiation with 20‐MeV 35Cl4+ was carried out at doses ranging from 1012 to 1014 ions/cm2. Residual gas analysis was performed during
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5413164a83e90e77e0dca42d175670eb
https://doi.org/10.1063/1.344083
https://doi.org/10.1063/1.344083
Publikováno v:
Radiation Effects and Defects in Solids. 108:205-209
An ion track model was applied to describe MeV ion induced adhesion improvement of Au thin films on amorphous SiO_2. Good agreement with experimental data was found when assuming that ion track energy densities above and below a certain interval do n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c53a3441564ed05bf2b9906057165c8e
https://doi.org/10.1080/10420158908230309
https://doi.org/10.1080/10420158908230309
Publikováno v:
Journal of Adhesion Science and Technology. 3:503-514
Conversion electron Mossbauer spectroscopy was used to study ion beam-induced effects at Fe-PTFE thin film interfaces and to relate these effects to accompanying modifications in adhesion. Irradiation with 16 MeV 32S3+ ions to doses ranging from 5 x
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fdbe7ba526c53a7050788fb4e322cf6
https://doi.org/10.1163/156856189x00362
https://doi.org/10.1163/156856189x00362
Publikováno v:
Applied Physics Letters. 54:1513-1515
The effect of 20 MeV Cl4 + ions incident on Au-SiO2 and Ag-SiO2 interfaces was investigated using high-resolution transmission electron microscopy. Cross-sectional micrographs expose beam-induced gold interfacial transport and migration into the SiO2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de55d9028cef9a83b85c9607b3a9ba55
https://doi.org/10.1063/1.101383
https://doi.org/10.1063/1.101383
Autor:
Whitlow, Harry J., Andersson, Margaretha, Hult, Mikael, Persson, Leif, Bouanani, Mohamed El, Östling, Mikael, Zaring, Carina, Lundberg, Nils, Cohen, David D., Dytlewski, Nick, Johnston, Peter N., Bubb, Ian F., Walker, Scott R., Johanson, Erik, Hogmark, Sture, Anders Ingemarsson, P.
Publikováno v:
Microchimica Acta; March 1995, Vol. 120 Issue: 1-4 p171-181, 11p
Autor:
P. Anders Ingemarsson, T. A. Tombrello
Publikováno v:
MRS Proceedings. 119
We report on the use of 20 MeV C14+ ion beams for pre-irradiation of Si, SiO2 and Al2O3 surfaces with resulting alterations in the adhesion of subsequently deposited Au and Ag thin films. The effect does not follow the same pattern for Au and Ag film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d609cd6f0778696dc16237f4d99437cf
https://doi.org/10.1557/proc-119-103
https://doi.org/10.1557/proc-119-103