Zobrazeno 1 - 10
of 73
pro vyhledávání: '"Owen, J. H. G."'
Autor:
Liddle, J. Alexander, Ruiz, Ricardo, Owen, J. H. G., Santini, R., Haq, M., Fuchs, E., Randall, J. N.
Publikováno v:
Proceedings of SPIE; April 2024, Vol. 12956 Issue: 1 p129560C-129560C-6, 1166047p
We present a detailed study of the structural and electronic properties of a self-assembled silicon nanoline embedded in the H-terminated silicon (001) surface, known as the Haiku stripe. The nanoline is a perfectly straight and defect free endotaxia
Externí odkaz:
http://arxiv.org/abs/1103.3142
Single atom metallic wires of arbitrary length are of immense technological and scientific interest. We describe a novel silicon-only template enabling the self-organised growth of isolated micrometer long surface and subsurface single-atom chains. I
Externí odkaz:
http://arxiv.org/abs/1007.2108
A number of different families of nanowires which self-assemble on semiconductor surfaces have been identified in recent years. They are particularly interesting from the standpoint of nanoelectronics, which seeks non-lithographic ways of creating in
Externí odkaz:
http://arxiv.org/abs/cond-mat/0510825
Heteroepitaxial strain can be a controlling factor in the lateral dimensions of 1-D nanostructures. Bi nanolines on Si(001) have an atomic structure which involves a large sub-surface reconstruction, resulting in a strong elastic coupling to the surr
Externí odkaz:
http://arxiv.org/abs/cond-mat/0212514
Autor:
Bowler, D. R., Owen, J. H. G.
We describe how we have used tight binding calculations as a quick, efficient tool to search for possible structures of Bi nanolines on Si(001). After identifying promising candidate structures, we have concentrated on these with \textit{ab initio} e
Externí odkaz:
http://arxiv.org/abs/cond-mat/0202530
Stress resulting from mismatch between a substrate and an adsorbed material has often been thought to be the driving force for the self-assembly of nanoscale structures. Bi nanolines self-assemble on Si(001), and are remarkable for their straightness
Externí odkaz:
http://arxiv.org/abs/cond-mat/0202529
Akademický článek
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Autor:
Owen, J. H. G.1 james.owen@nims.go.jp, Miki, K.1 miki.kazushi@nims.go.jp, Bowler, D. R.1,2,3 david.bowler@ucl.ac.uk
Publikováno v:
Journal of Materials Science. Jul2006, Vol. 41 Issue 14, p4568-4603. 36p. 3 Color Photographs, 23 Black and White Photographs, 6 Diagrams, 1 Chart, 8 Graphs.