Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Overberghe, J."'
Autor:
Heidi Belet, Coppieters, P., Cornelissen, L., Creten, H., Ignace Glorieux, Dhont, T., Ilse Laurijssen, Maes, L., Matheus, N., Eddy Omey, Schatteman, T., Hallen, P., Velde, V., Overberghe, J., Trier, W., Verhaest, D., Elsy Verhofstadt
Publikováno v:
Vrije Universiteit Brussel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7f52d5ed23df3ae0657d2f7a32b421b4
https://biblio.vub.ac.be/vubir/hoe-maken-vlaamse-jongeren-de-overgang-van-school-naar-werk-basisrapportering-cohorte-1976-tweede-golf-eindrapport-pbo99-deel-2(677fcc18-0a4a-4591-8b44-c3119d9e595f).html
https://biblio.vub.ac.be/vubir/hoe-maken-vlaamse-jongeren-de-overgang-van-school-naar-werk-basisrapportering-cohorte-1976-tweede-golf-eindrapport-pbo99-deel-2(677fcc18-0a4a-4591-8b44-c3119d9e595f).html
Autor:
Heidi Belet, Coppieters, P., Cornelissen, L., Creten, H., Ignace Glorieux, Ilse Laurijssen, Maes, L., Mattheus, N., Eddy Omey, Schatteman, T., Hallen, P., Velde, V., Overberghe, J., Trier, W., Verhaest, D., Elsy Verhofstadt
Publikováno v:
Vrije Universiteit Brussel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::96b46a046354e8a4dc0294a6a9a1b5f7
https://researchportal.vub.be/en/publications/7029a6b1-da5d-4b4f-81ed-f770601946a5
https://researchportal.vub.be/en/publications/7029a6b1-da5d-4b4f-81ed-f770601946a5
Publikováno v:
IEEE Transactions on Nuclear Science; Dec2012 Part 1, Vol. 59 Issue 6, p2658-2665, 8p
Publikováno v:
Foundations & Trends in Electronic Design Automation; 2010, Vol. 4 Issue 2/3, p211-221, 11p
Publikováno v:
International Journal of High Speed Electronics & Systems; Dec2008, Vol. 18 Issue 4, p815-824, 10p, 3 Diagrams, 3 Graphs
Publikováno v:
IEEE Transactions on Nuclear Science; Aug2008 Part 1 of 2, Vol. 55 Issue 4, p2126-2132, 7p, 3 Diagrams, 3 Charts, 9 Graphs
Publikováno v:
IEEE Transactions on Nuclear Science; Dec2006 Part 1 of 2, Vol. 53 Issue 6, p3587-3595, 9p, 1 Diagram, 5 Charts, 3 Graphs
Autor:
Sorin Cristoloveanu, Michael S Shur
Frontiers in Electronics contains the selected best papers presented at the Workshop on Frontiers in Electronics (WOFE-07). This meeting was the fifth in the series of WOFE workshops, and strongly reinforced the tradition of scientific quality and vi
Autor:
Seifert, Norbert
Chip-level soft-error rate (SER) estimation can come from two sources: direct experimental measurement and simulation. Because SER mitigation decisions need to be made very early in the product design cycle, long before product Si is available, a sim