Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling

Autor: Schmitt, P., Pressecq, F., Lafontan, X., Duong, Q.H., Pons, P., Nicot, J.M., Oudea, C., Estève, D., Fourniols, J.Y., Camon, H.

Publikováno v: In Microelectronics Reliability 2003 43(9):1957-1962

Experimental Analysis of recombination and neutralization of radiation induced charges, using Isochronal Annealing

Autor: Quittard, O., Saigné, F., Joffre, F., Oudea, C., Dusseau, L., Fesquet, J., Gasiot, J.

Publikováno v: 5th European Conference on Radiation and its Effects on Components and Systems (RADECS1999)
5th European Conference on Radiation and its Effects on Components and Systems (RADECS1999), 1999, Fontevreau, France
IEEE-RADECS2000
IEEE-RADECS2000, 2000, Louvain La Neuve, Belgium

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::057625cbb2175902afdbacc85775583f
https://hal.archives-ouvertes.fr/hal-01803889

Recent Advances in Wearable Healthcare Devices: From Material to Application.

Autor: Luo, Xiao^1,2 (AUTHOR) xluoay@connect.ust.hk, Tan, Handong³ (AUTHOR) htanaf@connect.ust.hk, Wen, Weijia^1,2 (AUTHOR) phwen@ust.hk

Publikováno v: Bioengineering (Basel). Apr2024, Vol. 11 Issue 4, p358. 31p.

Experimental analysis of recombination and neutralization of radiation-induced charges, using isochronal annealing.

Autor: Quittard, O., Brisset, C., Joffre, F., Oudea, C., Saigne, F., Dusseau, L., Fesquet, J., Gasiot, J.

Publikováno v: 1999 Fifth European Conference on Radiation & Its Effects on Components & Systems RADECS 99 (Cat No99TH8471); 2000, p512-518, 7p

Effects of input bias on different commercial technological lines of CMOS inverters with respect to the cumulated dose.

Autor: Quittard, O., Joffre, F., Oudea, C., Dusseau, L., Fesquet, J., Gasiot, J.

Publikováno v: 1998 IEEE Radiation Effects Data Workshop NSREC 98 Workshop Record Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat No98TH8385); 1998, p137-141, 5p