Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Osman Kubilay Ekekon"'
Publikováno v:
VTS
In this work, a new IDDQ built-in self-test (BIST) solution is proposed to provide accurate on-chip current measurements for phase-locked loops (PLLs) found in deep-submicron system-on-chip (SoC) products. The proposed method characterizes PLL loop p
Publikováno v:
AIP Conference Proceedings.
Recent developments in RF technology are focused on reaching the terahertz range of operation. The electron saturation velocity in semiconductors is still limited to −5×107 cm/s even if the electron transport is ballistic. The saturation velocity
Publikováno v:
SoCC
In this work, power minimization method for Varicap Threshold Logic (VcTL) implementations is proposed. In this aspect, characteristics of NMOS and PMOS capacitances are investigated. AND-OR gates and full adder (FA) are selected to prove the propose
Publikováno v:
European Test Symposium
The paper presents a novel programmable Built In Current Sensor (BICS) topology in IBM 65 nm CMOS technology. Proposed topology has 2.086 GHz bandwidth and 38.9ps detection time. Moreover, a new built-in IDDQ test flow is proposed. Proposed test flow