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Autor:
Nahikari Gonzalez, Oscar Matilla, Lucia Aballe, Michael Foerster, Eric Pellegrin, Jordi Prat, Abel Fontsere, Bernat Molas, Valenti Massana
Publikováno v:
Ultramicroscopy. 171:63-69
A variety of custom-built sample holders offer users a wide range of non-standard measurements at the ALBA synchrotron PhotoEmission Electron Microscope (PEEM) experimental station. Some of the salient features are: an ultrahigh vacuum (UHV) suitcase