Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Oscar Iglesias-Freire"'
Autor:
Miriam Jaafar, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, Agustina Asenjo
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 2, Iss 1, Pp 552-560 (2011)
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferrom
Externí odkaz:
https://doaj.org/article/fb1fa985c37f4a60bfb9513b7dd4147f
Autor:
Teresa, J. deteresa@unizar.es, Fernández-Pacheco, A.1 af457@cam.ac.uk
Publikováno v:
Applied Physics A: Materials Science & Processing. Dec2014, Vol. 117 Issue 4, p1645-1658. 14p. 5 Black and White Photographs, 1 Diagram, 3 Graphs.
Autor:
Sirohi, Anshu, Sheet, Goutam
Publikováno v:
AIP Conference Proceedings; 2016, Vol. 1731 Issue 1, p1-3, 3p, 1 Diagram, 5 Graphs