Zobrazeno 1 - 1
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pro vyhledávání: '"Osama S. Elsherif"'
Publikováno v:
Materials Science Forum. :1315-1318
Admittance spectroscopy (AS) and deep level transient spectroscopy (DLTS) have been applied to B-doped thin polycrystalline diamond films deposited on p+-silicon by hot filament chemical vapour deposition. Films with two boron concentrations (1.5×10
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1de6341cf6a3e201ba88ae65ab3665e
https://doi.org/10.4028/www.scientific.net/msf.717-720.1315
https://doi.org/10.4028/www.scientific.net/msf.717-720.1315
