Zobrazeno 1 - 10
of 710
pro vyhledávání: '"Ortolano G"'
Autor:
Fazio, E., Ortolano, G., Alsop, G.I., D'Agostino, A., Visalli, R., Luzin, V., Salvemini, F., Cirrincione, R.
Publikováno v:
In Journal of Structural Geology October 2024 187
Autor:
Caso, F., Piloni, C.B., Filippi, M., Pezzotta, A., Fazio, E., Visalli, R., Ortolano, G., Roda, M., Zucali, M.
Publikováno v:
In Journal of Structural Geology May 2024 182
Akademický článek
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Autor:
Ortolano, G.1, Pagano, M.1 mario.pagano@unict.it, Visalli, R.1, Angì, G.1, D'Agostino, A.1, Muto, F.2, Tripodi, V.2, Critelli, S.2, Cirrincione, R.1
Publikováno v:
Journal of Maps. Jan-Dec2022, Vol. 18 Issue 2, p314-330. 17p.
Autor:
Ortolano, G.1 (AUTHOR) ortolano@unict.it, Visalli, R.1 (AUTHOR), Fazio, E.1 (AUTHOR), Fiannacca, P.1 (AUTHOR), Godard, G.2 (AUTHOR), Pezzino, A.1 (AUTHOR), Punturo, R.1 (AUTHOR), Sacco, V.1 (AUTHOR), Cirrincione, R.1 (AUTHOR)
Publikováno v:
International Journal of Earth Sciences. Jun2020, Vol. 109 Issue 4, p1295-1319. 25p.
Autor:
Linstrum E, Clarke P, Bingham A, Black L, Langhamer C, Delap L, Meyer J, Ortolano G, Pedersen S, Bailkin J, Subramanian D
Publikováno v:
Modern British history [Mod Br Hist] 2024 Apr 30; Vol. 35 (1), pp. 7-29.
Autor:
Ortolano G; New York University, New York, USA.
Publikováno v:
Modern British history [Mod Br Hist] 2024 Apr 30; Vol. 35 (1), pp. 109-112.
Autor:
Ortolano G; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy. g.ortolano@inrim.it.; DISAT, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129, Torino, Italy. g.ortolano@inrim.it., Paniate A; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy.; DISAT, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129, Torino, Italy., Boucher P; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy., Napoli C; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy., Soman S; Imaging Physics Department Optics Research Group, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628CJ, Delft, The Netherlands., Pereira SF; Imaging Physics Department Optics Research Group, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628CJ, Delft, The Netherlands., Ruo-Berchera I; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy., Genovese M; Quantum Metrology and Nano Technology Division, INRiM, Strada delle Cacce 91, 10135, Torino, Italy.
Publikováno v:
Light, science & applications [Light Sci Appl] 2023 Jul 11; Vol. 12 (1), pp. 171. Date of Electronic Publication: 2023 Jul 11.
