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pro vyhledávání: '"Organic solderability preservative"'
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Publikováno v:
Soldering & Surface Mount Technology, 2017, Vol. 29, Issue 2, pp. 99-109.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/SSMT-05-2016-0010
Publikováno v:
Journal of Materials Research and Technology, Vol 11, Iss, Pp 1895-1910 (2021)
Intermetallic compound(s) (IMC) that nucleates at the interface between solder and Cu trace during a soldering reaction, is one of the most crucial factors for microelectronic packaging reliability. This study was conducted to modify the IMC microstr
Autor:
Yong-Ho Ko, Gyu-Won Jeong, Min-Su Kim, Han-Bo-Ram Lee, Jungsoo Kim, Seungju Baek, Junhyuk Son
Publikováno v:
Journal of Materials Science: Materials in Electronics. 32:3324-3333
Power modules are being increasingly used as essential parts in eco-friendly vehicles, and they are generally exposed to high temperatures during operation. To this end, electronic interconnection methods that can enhance durability and help withstan
Autor:
Jitrin Chaiprapa, N. R. Abdul Razak, Kazuhiro Nogita, Mohd Arif Anuar Mohd Salleh, S. F. N. Muhd Amli, Mohd Izrul Izwan Ramli, Hideyuki Yasuda
Publikováno v:
Journal of Electronic Materials. 50:855-868
The effects of copper organic solderability preservative (Cu-OSP) and electroless nickel immersion gold (ENIG) surface finish reflowed on Sn-3.0Ag-0.5Cu (SAC305) solder have been investigated in detail. Besides conventional cross-sectional microstruc
Autor:
Siti Farahnabilah Muhd Amli, Mohd Izrul Izwan Ramli, Nurul Razliana Abdul Razak, Mohd Arif Anuar Mohd Salleh
Publikováno v:
Sains Malaysiana. 49:3255-3259
The influence of bismuth (Bi) addition on wettability, thickness of interfacial intermetallic compound (IMC), and microhardness properties of Sn-0.7Cu + xBi solder alloy using different types of substrate were examined. The 0.5, 1.0, 1.5, and 2.0 wt.
Autor:
Flora Somidin, Kazuhiro Nogita, Hideyuki Yasuda, Z. Shayfull, Mohd Izrul Izwan Ramli, Jitrin Chaiprapa, S. F. N. Muhd Amli, Mohd Arif Anuar Mohd Salleh
Publikováno v:
Journal of Electronic Materials. 50:710-722
This study examines factor(s) behind the formation of primary Cu6Sn5 (in the bulk, rather than at the interface) in solder joints, even though solder alloys are hypoeutectic. To understand the contribution from copper (Cu) dissolution from the substr
Autor:
Rick Nichols
Publikováno v:
Lead-free Soldering Process Development and Reliability
Autor:
Jenq-Gong Duh, Collin Fleshman
Publikováno v:
Journal of Electronic Materials. 49:196-201
The correlations between different Ni contents in Sn-1.2Ag-0.5Cu-xNi (wt.%; x = 0, 0.05, 0.1)/organic solderability preservative Cu solder joints and shear test performance before and after aging were probed. With the aid of electron back scattering
Publikováno v:
Journal of Alloys and Compounds. 775:581-588
We investigated the effect of Ag-coated multi-walled carbon nanotubes (Ag-MWCNT) on the microstructures and electromigration behaviors of a Sn58%Bi solder and organic solderability preservative (OSP) surface finished on the FR-4 printed circuit board