Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Orasson, A."'
Publikováno v:
In Microprocessors and Microsystems 2008 32(5):254-262
Publikováno v:
Acta Neurologica Scandinavica. Sep2001, Vol. 104 Issue 3, p148-155. 8p.
Publikováno v:
In Brain and Cognition April 1999 39(3):187-201
Publikováno v:
2016 11th European Workshop on Microelectronics Education (EWME)
EWME
EWME
We propose a tool set for teaching and e-learning the main principles of design-for-testability technics for digital systems. It is a collection of software tools which simulate a circuit under test, emulate a pool of different strategies, methods an
Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs
Publikováno v:
VLSI-SoC: Design for Reliability, Security, and Low Power
IFIP Advances in Information and Communication Technology
IFIP Advances in Information and Communication Technology-VLSI-SoC: Design for Reliability, Security, and Low Power
VLSI-SoC: Design for Reliability, Security, and Low Power ISBN: 9783319460963
VLSI-SoC (Selected Papers)
IFIP Advances in Information and Communication Technology
IFIP Advances in Information and Communication Technology-VLSI-SoC: Design for Reliability, Security, and Low Power
VLSI-SoC: Design for Reliability, Security, and Low Power ISBN: 9783319460963
VLSI-SoC (Selected Papers)
The paper presents a new method and an algorithm for structural fault collapsing to reduce the search space for test generation, to speed up fault simulation and to make the fault diagnosis easier in digital circuits. The proposed method is based on
Publikováno v:
Microprocessors and Microsystems. 32:254-262
Classical built-in self-test (BIST) approaches are largely based on pseudorandom testing, and using linear feedback shift registers (LFSR) for test set generation and test response compaction. In this paper, we are concentrating on one possible exten
Publikováno v:
DSD
The paper presents a new structural fault collapsing method with linear algorithmic complexity to reduce the search space for test generation and fault diagnosis in digital circuits. The method is based on the two phase topology analysis of the circu
Publikováno v:
Acta Neurologica Scandinavica. 104:148-155
Objectives - To assess psychological coping strategies and their relationship with outcome in patients after primary subarachnoid haemorrhage (SAH). Patients and methods - In 51 unselected patients (24 males, 27 females; mean age 46 years) in an aver
Publikováno v:
Brain and Cognition. 39:187-201
Brain damage is usually associated with behavioral deficits. However, there is an increasing amount of evidence that lesions of some brain regions are associated with improvements instead of impairments of certain behaviors. We report the results of
Publikováno v:
NORCHIP
A methodology for organization of at-speed functional Built-In Self-Test in processors, based on real functional routines is presented. The proposed self-test includes on-chip test application and response collection by using the functionality of the