Zobrazeno 1 - 10
of 508
pro vyhledávání: '"Ophus, C"'
Autor:
Siddiqui, K. M., Durham, D. B., Cropp, F., Ji, F., Paiagua, S., Ophus, C., Andresen, N. C., Jin, L., Wu, J., Wang, S., Zhang, X., You, W., Murnane, M., Centurion, M., Wang, X., Slaughter, D. S., Kaindl, R. A., Musumeci, P., Minor, A. M., Filippetto, D.
The ability to resolve the dynamics of matter on its native temporal and spatial scales constitutes a key challenge and convergent theme across chemistry, biology, and materials science. The last couple of decades have witnessed ultrafast electron di
Externí odkaz:
http://arxiv.org/abs/2306.04900
Autor:
Husremović, S., Goodge, B. H., Erodici, M., Inzani, K., Mier, A., Ribet, S. M., Bustillo, K. C., Taniguchi, T., Watanabe, K., Ophus, C., Griffin, S. M., Bediako, D. K.
High-density phase change memory (PCM) storage is proposed for materials with multiple intermediate resistance states, which have been observed in 1$T$-TaS$_2$ due to charge density wave (CDW) phase transitions. However, the metastability responsible
Externí odkaz:
http://arxiv.org/abs/2303.04387
A Twinning Induced Plasticity (TWIP) steel with a nominal composition of Fe-16.4Mn-0.9C-0.5Si-0.05Nb-0.05V was deformed to an engineering strain of 6\%. The strain around the deformation twins were mapped using the 4D-STEM technique. Strain mapping s
Externí odkaz:
http://arxiv.org/abs/2209.15522
Autor:
Clauser, A.L., Oware Sarfo, K., Ophus, C., Ciston, J., Giulian, R., Árnadóttir, L., Santala, M.K.
Publikováno v:
In Acta Materialia 1 December 2024 281
We measure the stress state in and around a deformation nanotwin in a twinning-induced plasticity (TWIP) steel. Using four-dimensional scanning transmission electron microscopy (4D-STEM), we measure the elastic strain field in a 68.2-by-83.1 nm area
Externí odkaz:
http://arxiv.org/abs/2004.03982
Autor:
Kwok, T.W.J., McAuliffe, T.P., Ackerman, A.K., Savitzky, B.H., Danaie, M., Ophus, C., Dye, D.
Publikováno v:
In Materials Science & Engineering A 17 May 2023 873
Autor:
Gray, A. X., Minár, J., Plucinski, L., Huijben, M., Bostwick, A., Rotenberg, E., Yang, S. -H., Braun, J., Winkelmann, A., Conti, G., Eiteneer, D., Rattanachata, A., Greer, A. A., Ciston, J., Ophus, C., Rijnders, G., Blank, D. H. A., Doennig, D., Pentcheva, R., Schneider, C. M., Ebert, H., Fadley, C. S.
Angle-resolved photoemission spectroscopy (ARPES) is a powerful technique for the study of electronic structure, but it lacks a direct ability to study buried interfaces between two materials. We address this limitation by combining ARPES with soft x
Externí odkaz:
http://arxiv.org/abs/1309.2022
Autor:
Sankaran, R.P., Ozdol, V.B., Ophus, C., Kacher, J., Gammer, C., Govindjee, S., Minor, A.M., Morris, J.W., Jr.
Publikováno v:
In Acta Materialia 1 June 2018 151:334-346
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Akademický článek
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