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pro vyhledávání: '"Ong, Jonathan"'
Autor:
Ong, Jonathan Lian K, Jalaludin, Nur Fatimah Farzanah, Wong, Meng Kang, Tan, Sheng Hui, Angelina, Clara, Sukhatme, Sarvesh A., Yeo, Trifanny, Lim, Chwee Teck, Lee, York Tien, Soh, Shui Yen, Lim, Tony K.H., Tay, Timothy Kwang Yong, Chang, Kenneth Tou En, Chen, Zhi Xiong, Loh, Amos HP
Publikováno v:
In Translational Oncology August 2024 46
Autor:
ONG, JONATHAN CORPUS
Publikováno v:
Contemporary Southeast Asia, 2022 Dec 01. 44(3), 396-403.
Externí odkaz:
https://www.jstor.org/stable/27193037
Autor:
Tseng, I-Lun, Li, Yongfu, Perez, Valerio, Tripathi, Vikas, Lee, Zhao Chuan, Ong, Jonathan Yoong Seang
At advanced process nodes, lithography weakpoints can exist in physical layouts of integrated circuit designs even if the layouts pass design rule checking (DRC). Existence of lithography weakpoints in a physical layout can cause manufacturability is
Externí odkaz:
http://arxiv.org/abs/1810.01446
Autor:
Tseng, I-Lun, Perez, Valerio, Li, Yongfu, Lee, Zhao Chuan, Tripathi, Vikas, Ong, Jonathan Yoong Seang
At advanced process nodes, pattern matching techniques have been used in the detection of lithography hotspots, which can affect yields of manufactured integrated circuits. Although commercial pattern matching and in-design hotspot fixing tools have
Externí odkaz:
http://arxiv.org/abs/1808.05998
To evaluate the quality of physical layout designs in terms of manufacturability, DFM rule scoring techniques have been widely used in physical design and physical verification phases. However, one major drawback of conventional DFM rule scoring meth
Externí odkaz:
http://arxiv.org/abs/1808.05999
Publikováno v:
Synopsys User Group Penang (SNUG) 2017
As compared to DRC rules, DFM rules are a list of selected recommended rules which aim to improve the design margins for better manufacturability. In GLOBALFOUNDRIES, we use DFM scoring methodology as an effective technique to analyze design quality
Externí odkaz:
http://arxiv.org/abs/1805.10016
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