Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Omar Mekni"'
Publikováno v:
Journal of Applied Physics. 116:104104
Usually, the trapping phenomenon in insulating materials is studied by injecting charges using a Scanning Electron Microscope. In this work, we use the dielectric spectroscopy technique for showing a correlation between the dielectric properties and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8b08de3b8e75505f9ccc75c7e7db3f9
https://doi.org/10.1063/1.4895124
https://doi.org/10.1063/1.4895124
