Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Omar Mekni"'
Publikováno v:
Journal of Applied Physics. 116:104104
Usually, the trapping phenomenon in insulating materials is studied by injecting charges using a Scanning Electron Microscope. In this work, we use the dielectric spectroscopy technique for showing a correlation between the dielectric properties and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8b08de3b8e75505f9ccc75c7e7db3f9
https://doi.org/10.1063/1.4895124
https://doi.org/10.1063/1.4895124
Publikováno v:
Journal of Applied Physics; 2014, Vol. 116 Issue 10, p1-9, 9p, 3 Charts, 9 Graphs
Autor:
Blaise, G., Le Gressus, C.
Publikováno v:
AIP Advances; Sep2018, Vol. 8 Issue 9, pN.PAG-N.PAG, 22p