Zobrazeno 1 - 10
of 98
pro vyhledávání: '"Olsen, Arne"'
Autor:
Olsen, Arne E.
Various methods can be used to estimate the human health risk associated with exposure to contaminants at brownfields facilities. The deterministic method has been the standard practice, but the use of probabilistic methods is increasing. Contaminant
Externí odkaz:
http://hdl.handle.net/10919/34175
http://scholar.lib.vt.edu/theses/available/etd-07262001-150332/
http://scholar.lib.vt.edu/theses/available/etd-07262001-150332/
Autor:
Thøgersen, Annett, Mayandi, Jeyanthinath, Vines, Lasse, Sunding, Martin F., Olsen, Arne, Diplas, Spyros, Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 109, 084329 (2011)
The nucleation, distribution, composition and structure of Pd nanocrystals in SiO$_2$ multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron Microscopy (HRTEM) and X-ray Photoelectron Spectroscopy (XPS), before
Externí odkaz:
http://arxiv.org/abs/1210.0027
Autor:
Thøgersen, Annett, Mayandi, Jeyanthinath, Finstad, Terje, Olsen, Arne, Diplas, Spyros, Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 106, 014305 (2009)
The nucleation, distribution and composition of erbium embedded in a SiO$_2$-Si layer were studied with High Resolution Transmission Electron Microscopy (HRTEM), Electron Energy Loss Spectroscopy (EELS), Energy Filtered TEM (EFTEM), Scanning Transmis
Externí odkaz:
http://arxiv.org/abs/1210.0016
Autor:
Thøgersen, Annett, Mayandi, Jeyanthinath, Finstad, Terje G., Olsen, Arne, Christensen, Jens Sherman, Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 104, 094315 (2008)
The nucleation and structure of silicon nanocrystals formed by different preparation conditions and silicon concentration (28 - 70 area %) have been studied using Transmission Electron Microscopy (TEM), Energy Filtered TEM (EFTEM) and Secondary Ion M
Externí odkaz:
http://arxiv.org/abs/1209.6623
Autor:
Thøgersen, Annett, Diplas, Spyros, Mayandi, Jeyanthinath, Finstad, Terje, Olsen, Arne, Watts, John F., Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 103, 024308 (2008)
Crystalline and amorphous nanoparticles of silicon in thin silica layers were examined by transmission electron microscopy (TEM), electron energy loss spectroscopy (EELS) and x-ray photoelectron spectroscopy (XPS). We used XPS data in the form of the
Externí odkaz:
http://arxiv.org/abs/1209.6598
Autor:
Lundmark, Katarzyna, Westermark, Gunilla T., Olsén, Arne, Westermark, Per, Gajdusek, D. Carleton
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America, 2005 Apr . 102(17), 6098-6102.
Externí odkaz:
https://www.jstor.org/stable/3375259
Publikováno v:
In Materials Characterization April 2015 102:71-78