Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Ollier, Eric"'
Autor:
Ben, Fang, Fernando, James, Ou, Jun-Yu, Dupré, Cécilia, Ollier, Eric, Hassani, Faezeh Arab, Mizuta, Hiroshi, Tsuchiya, Yoshishige
Publikováno v:
In Micro and Nano Engineering June 2023 19
Autor:
Koumela, Alexandra, Hentz, Sébastien, Mercier, Denis, Dupré, Cécilia, Ollier, Eric, Feng, Philip X-L, Purcell, Stephen T, Duraffourg, Laurent
We report here the first realization of top-down silicon nanowires (SiNW) transduced by both junction-less field effect transistor (FET) and the piezoresistive (PZR) effect. The suspended SiNWs are among the smallest top-down SiNWs reported to date,
Externí odkaz:
http://arxiv.org/abs/1307.8243
Autor:
Duraffourg, Laurent, Colinet, Eric, Hentz, Sebastien, Ollier, Eric, Andreucci, Philippe, Reig, Bruno, Robert, Philippe
Publikováno v:
Applied Physics Letters 92 (2008) 174106
We propose a simple analytical model of a metal-oxide-semiconductor field-effect transistor with a lateral resonant gate based on the coupled electromechanical equations, which are self-consistently solved in time. All charge densities according to t
Externí odkaz:
http://arxiv.org/abs/1001.2148
Autor:
Vivet, Pascal, Arnaud, Lucile, Borel, Stephan, Bresson, Nicolas, Assous, Myriam, Nicolas, Stephane, Mauguen, Gaelle, Moreau, Stephane, Altieri Scarpato, Mauricio, Billoint, Olivier, Thuries, Sebastien, Ollier, Eric
Publikováno v:
2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Apr 2022, Taiwan, Taiwan. ⟨10.1109/VLSI-TSA54299.2022.9771026⟩
2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Apr 2022, Taiwan, Taiwan. ⟨10.1109/VLSI-TSA54299.2022.9771026⟩
International audience; CMOS Imagers have adopted 3D integration using Back-Side Illumination (BSI) technology, with 2 CMOS layers assembled using Wafer-to-Wafer and advanced Hybrid Bonding technology. Targeting innovative AI and Machine Learning app
Autor:
Tsuchiya, Yoshishige, Harada, Naoaki, Giotis, Christos, Lamb, Joshua, Arab Hassani, Faezeh, Shikida, Mitsuhiro, Dupré, Cecilia, Ollier, Eric, Bartsch, Sebastian, Mihai Ionescu, Adrian, Mizuta, H.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______348::113df760bc437b8856b04f22ecb71a5d
https://eprints.soton.ac.uk/413831/
https://eprints.soton.ac.uk/413831/
Publikováno v:
In Sensors & Actuators: A. Physical 1999 73(1):117-121
Autor:
Laporte, M., Contancias, C., Bruel, M., Ollier, Eric, Salhi, M., Margail, J., Enot, T., Divoux, C., Berruyer, P., Bontemps, André
Publikováno v:
Journées Nationales d'Optique Guidée, JNOG 2003
Journées Nationales d'Optique Guidée, JNOG 2003, Sep 2003, Valence, France
Journées Nationales d'Optique Guidée, JNOG 2003, Sep 2003, Valence, France
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5343289a75a5acd2e2c6745d419f1472
https://hal.archives-ouvertes.fr/hal-00200271
https://hal.archives-ouvertes.fr/hal-00200271
Publikováno v:
Congrès Français de Thermique, SFT 2003
Congrès Français de Thermique, SFT 2003, Jun 2003, Grenoble, France
Congrès Français de Thermique, SFT 2003, Jun 2003, Grenoble, France
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d9518db9f9bbb6c35cca58c1dd8fd1bd
https://hal.science/hal-00200247
https://hal.science/hal-00200247
Autor:
Ernst, Thomas, Hentz, Sebatien, Arcamone, Julien, Agache, Vincent, Duraffourg, Laurent, Ouerghi, Issam, Ludurczak, Willy, Ladner, Carine, Ollier, Eric, Andreucci, Philippe, Colinet, Eric, Puget, Pierre
Publikováno v:
2015 45th European Solid State Device Research Conference (ESSDERC); 2015, p31-35, 5p
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