Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Olivier Vendier"'
Autor:
Evan Roue, Vincent Laur, Alexis Chevalier, Gerard Tanne, Camille Parris, Olivier Vendier, Rose-Marie Sauvage
Publikováno v:
2021 51st European Microwave Conference (EuMC).
Autor:
Frédéric Veron, Fabien Lanoue, Valérie Baco-Carles, Kateryna Kiryukhina, Olivier Vendier, Philippe Tailhades
Publikováno v:
Additive Manufacturing. 50:102550
Autor:
Jean-Louis Cazaux, L. Marchand, Pascal Tristant, Claude Drevon, Alain Catherinot, Arnaud Pothier, Olivier Vendier, Frédéric Dumas-Bouchiat, Aurelian Crunteanu, Pierre Blondy, Corinne Champeaux
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2006, 49 (9-16), pp.1741-1746
Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1741-1746. ⟨10.1016/j.microrel.2006.07.065⟩
Microelectronics Reliability, Elsevier, 2006, 49 (9-16), pp.1741-1746
Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1741-1746. ⟨10.1016/j.microrel.2006.07.065⟩
Proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Wuppertal, Germany 3rd-6th October 2006; International audience; Dielectric-based RF MEMS capacitive switches were fabricated and characteriz
Autor:
David Dubuc, D. De Conto, J.L. Muraro, Robert Plana, Katia Grenier, Olivier Vendier, J.L. Cazaux, S. Melle
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 53:3482-3488
The kinetic of dielectric charging in capacitive RF microelectromechanical systems (RF MEMS) is investigated using an original method of stress and monitoring. This effect is investigated through a new parameter: the shift rate of the actuation volta
Autor:
D. De Conto, J.L. Muraro, J.L. Cazaux, C. Bordas, David Dubuc, Robert Plana, Laurent Bary, S. Melle, B. Poussard, Katia Grenier, Olivier Vendier, Laurent Mazenq
Publikováno v:
Microelectronics Reliability. 45:1770-1775
This paper reports on the investigation of the failure mechanism in capacitive RF-MEMS through an efficient analysis methodology. We demonstrate that the physical origin of the dielectric charging is the leakage current through the RF-MEMS dielectric
Autor:
L. Bary, F. Flourens, S. Melle, David Dubuc, Olivier Vendier, M. Saddaoui, Alexandru Takacs, L. Rabbia, Robert Plana, J.L. Roux, Patrick Pons, A. Boukabache, Hervé Aubert, Katia Grenier, B. Ducarouge
Publikováno v:
Microelectronics Reliability. 44:899-907
This paper presents a fully suspended MEMS based technology to assess the smart microsystem concept. The demonstrator is a redundancy ring for millimeterwave space communication. Reliability investigations are presented showing that the membrane is w
Publikováno v:
Microwave and Optical Technology Letters. 44:24-29
This paper deals with an H-shaped slot etched in a thick ground plane to feed multilayer antenna arrays. This study takes place under the European MIPA project 1, which concerns an antenna prototype that is part of a Q-band (50-GHz) one-feed-per-beam
Autor:
Manuel Carmona, Olivier Vendier, J. Puigcorbe, D. Floriot, Santiago Marco, H. Blanck, S. Leseduarte, Sylvain Delage, C. Devron
Publikováno v:
Journal of Electronic Packaging. 125:549-555
The gold-gold thermocompression process for power heterostructure bipolar transistor (HBT) flip chip has been modelled and simulated by finite element method. A model for plated gold creep has been determined on the basis of empirical data and model
Publikováno v:
Microelectronics Reliability. 41:1591-1596
Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium. Alcatel Space, Adv Packaging, F-31037 Toulouse, France. United Monolith Semicond, D-89081 Ulm, Germany.Petersen, R, Limburgs Univ Ctr, Inst Mat Onderzoek, Wetenschapspk 1, B-3590 Diep
Autor:
Federico Casini, Paola Farinelli, Giovanni Mannocchi, Sergio Di Nardo, Benno Margesin, Giorgio De Angelis, Romolo Marcelli, Olivier Vendier, Larissa Vietzorreck
Publikováno v:
info:cnr-pdr/source/autori:Federico Casini, Paola Farinelli, Giovanni Mannocchi, Sergio Di Nardo, Benno Margesin, Giorgio De Angelis, Romolo Marcelli, Olivier Vendier and Larissa Vietzorreck/congresso_nome:10th International Symposium on RF MEMS and RF Microsystems, MEMSWAVE 2009/congresso_luogo:Trento/congresso_data:6-8 July 2009/anno:2009/pagina_da:49/pagina_a:54/intervallo_pagine:49–54
Broadband single pole four throw (SP4T) switches in coplanar (CPW) waveguide based on cantilever or clamped - clamped switches have been developed for use in space application. All the devices are manufactured on high-resistive silicon using surface
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=cnr_________::bce5007f6d0df8ef566209c4978f4df1
https://publications.cnr.it/doc/245171
https://publications.cnr.it/doc/245171