Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Olivier Lauzeral"'
Publikováno v:
Proc. of IEEE 31st VLSI Test Symposium (VTS'13)
IEEE 31st VLSI Test Symposium (VTS'13)
IEEE 31st VLSI Test Symposium (VTS'13), Apr 2013, Berkeley, United States. pp.1, ⟨10.1109/VTS.2013.6548898⟩
VTS
IEEE 31st VLSI Test Symposium (VTS'13)
IEEE 31st VLSI Test Symposium (VTS'13), Apr 2013, Berkeley, United States. pp.1, ⟨10.1109/VTS.2013.6548898⟩
VTS
ISBN 978-1-4673-5542-1; International audience; Today, there are several trends that are making the reliability analysis of complex integrated circuits an important challenge in industry. As transistor geometries shrink, the number of physical failur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a45a11fb70663cd7371fa4bcbe977fd5
https://hal.archives-ouvertes.fr/hal-00842825
https://hal.archives-ouvertes.fr/hal-00842825
Autor:
Brendan D. McNally, Brett M. Clark, Jeffrey D. Wilkinson, Olivier Lauzeral, Jennifer Marckmann, Michael Tucker, Richard Wong, Yi He, Philippe Roche, Charles Slayman, Barry Carroll, Michael S. Gordon, Tommy Wu, Keith Lepla
Publikováno v:
2011 International Reliability Physics Symposium.
Alpha counting measurement methods have been widely used in the semiconductor industry for many years to assess the suitability of materials for semiconductor production and packaging applications. Although a number of published articles describe asp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4d63120188a7a7ab7c8cb76e109f167
https://doi.org/10.1109/irps.2011.5784521
https://doi.org/10.1109/irps.2011.5784521
Publikováno v:
2013 IEEE 31st VLSI Test Symposium (VTS); 2013, p1-1, 1p
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of se