Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Olivia Bluder"'
Autor:
Lukas A Holzer, Florian Sevelda, Georg Fraberger, Olivia Bluder, Wolfgang Kickinger, Gerold Holzer
Publikováno v:
PLoS ONE, Vol 9, Iss 3, p e92943 (2014)
BACKGROUND: Limb amputation is often an inevitable procedure in the advanced condition of various diseases and poses a dramatic impact on a patient's life. The aim of the present study is to analyze the impact of lower-limb amputations on aesthetic f
Externí odkaz:
https://doaj.org/article/171c7b3acb5c47509f4edb43d0627bf2
Publikováno v:
ICMLA
The semiconductor industry is currently leveraging to exploit machine learning techniques to improve and automate the manufacturing process. An essential step is the wafer test, where each single device is measured electrically, resulting in an image
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::722a8bf152de126cd7635b6126bc4a76
https://doi.org/10.1109/icmla.2018.00131
https://doi.org/10.1109/icmla.2018.00131
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783319929996
ICIAR
ICIAR
The importance of statistical lifetime models for the reliability assessment of semiconductors is increasing steadily, because resources and time are limited. The devices are tested under accelerated electrical and thermal conditions which causes deg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bad5c5c3b897b30636643fa1b480035
https://doi.org/10.1007/978-3-319-93000-8_55
https://doi.org/10.1007/978-3-319-93000-8_55
Publikováno v:
Risk Analysis. 35:1623-1639
In this article, Bayesian networks are used to model semiconductor lifetime data obtained from a cyclic stress test system. The data of interest are a mixture of log-normal distributions, representing two dominant physical failure mechanisms. Moreove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44435247a73fdf78396ba9bb91b87de6
https://doi.org/10.1111/risa.12342
https://doi.org/10.1111/risa.12342
Publikováno v:
IPTA
In semiconductor industry it is of paramount importance to check whether a manufactured device fulfills all quality specifications and is therefore suitable for being sold to the customer. The occurrence of specific spatial patterns within the so-cal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a71d4b338b7673162d3c51f92f207019
https://doi.org/10.1109/ipta.2017.8310124
https://doi.org/10.1109/ipta.2017.8310124
Publikováno v:
PAMM. 17:775-776
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74817d672ff6995f02b485889cc6b2e6
https://doi.org/10.1002/pamm.201710355
https://doi.org/10.1002/pamm.201710355
Publikováno v:
Microelectronics Reliability. 51:1464-1468
Reliability prediction of semiconductor devices gains importance, since demand increases and resources, e.g. time, are restricted. Normally, methods focusing on technology aspects are applied. This work presents a more mathematical approach by using
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2e02bad2ded8abd5ba174e282772e25
https://doi.org/10.1016/j.microrel.2011.06.038
https://doi.org/10.1016/j.microrel.2011.06.038
Publikováno v:
Risk analysis : an official publication of the Society for Risk Analysis. 35(9)
In this article, Bayesian networks are used to model semiconductor lifetime data obtained from a cyclic stress test system. The data of interest are a mixture of log-normal distributions, representing two dominant physical failure mechanisms. Moreove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::16ee7efc5a208583f39cabcc936c5d92
https://pubmed.ncbi.nlm.nih.gov/25683578
https://pubmed.ncbi.nlm.nih.gov/25683578
Publikováno v:
Proceedings of the Winter Simulation Conference 2014.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eff298b19f70949ece92d099f5abb2d6
https://doi.org/10.1109/wsc.2014.7020110
https://doi.org/10.1109/wsc.2014.7020110
Publikováno v:
Proceedings of the Winter Simulation Conference 2014.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::151b06a54c24ba6ad0b8646dc64d8cae
https://doi.org/10.1109/wsc.2014.7020111
https://doi.org/10.1109/wsc.2014.7020111