Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Oliver Wilhelmi"'
Autor:
Allan Pring, Joël Brugger, Oliver Wilhelmi, Gert Nolze, Steven A. Wakelin, Robert M. Hough, Lintern Fairbrother, Gordon Southam, Adrienne L. Gregg, Peta L. Clode, Frank Reith, John E. Parsons
Publikováno v:
Geology. 38:843-846
Biofilms living on gold (Au) grains play a key role in the biogeochemical cycle of Au by promoting the dispersion of Au via the formation of Au nanoparticles as well as the formation of secondary biomorphic Au. Gold grains from Queensland, Australia,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7a511c2870f86f6ca42f730a132138b
https://doi.org/10.1130/g31052.1
https://doi.org/10.1130/g31052.1
Publikováno v:
Journal of Experimental Nanoscience. 5:244-250
The fabrication of nanopatterns with a focussed ion beam (FIB) has recently been expanded to more complex nanopatterns with large numbers of individual pattern elements and covering larger pattern areas. We present two examples of FIB-fabricated larg
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf84ff91294788be44932a2ace04ba53
https://doi.org/10.1080/17458080903487448
https://doi.org/10.1080/17458080903487448
Publikováno v:
Journal of Nanoscience and Nanotechnology. 9:1268-1271
Techniques for characterisation and methods for fabrication at the nanoscale are becoming more powerful, giving new insights into the spatial relationships between nanostructures and greater control over their development. A case in point is the appl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d33e6027615b2f56e68b72bb79fef902
https://doi.org/10.1166/jnn.2009.c135
https://doi.org/10.1166/jnn.2009.c135
Autor:
Oliver Wilhelmi, Debbie J. Stokes, Laurent Roussel, Steve Reyntjens, D Hubert, Christoph Mitterbauer
Publikováno v:
Japanese Journal of Applied Physics. 47:5010-5014
State-of-the-art focused ion beam (FIB) technology combined with high-performance scanning electron microscopy (SEM) is making a big impact on nanotechnology, particularly with the ability to use either focused ions or electrons to perform advanced n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e572cc4fee6e6e6311a1dc654b9452d7
https://doi.org/10.1143/jjap.47.5010
https://doi.org/10.1143/jjap.47.5010
Publikováno v:
Microelectronic Engineering. :1107-1112
An in-house-made alignment system for deep X-ray lithography is presented that features low costs, low weight and little demand in space. Synchrotron radiation illuminates alignment marks on mask and substrate. The radiation transmitted through these
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a35d251e7f03d11182adbb3790c081f
https://doi.org/10.1016/s0167-9317(02)00584-1
https://doi.org/10.1016/s0167-9317(02)00584-1
Autor:
Oliver Wilhelmi, A. Schneider, SE Huq, B. Su, T.W. Button, R. A. Lawes, Philip D. Prewett, Laurence Singleton
Publikováno v:
Microsystem Technologies. 8:88-92
In this paper results are presented from a range of experiments to explore the feasibility of inserting a ceramic material PZT (lead zirconium titanate) into different kinds of high-aspect-ratio resist moulds. Polymethylmethacrylate (PMMA) and SU-8 o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69a489f5770a5e4c795f09486c812ecd
https://doi.org/10.1007/s00542-001-0141-y
https://doi.org/10.1007/s00542-001-0141-y
Autor:
Oliver Wilhelmi
Publikováno v:
Imaging & Microscopy. 9:54-56
DualBeam systems that combine a focused ion beam (FIB) with a scanning electron microscope (SEM) in a single instrument provide valuable rapid prototyping capability that can significantly shorten development times for nanoscale devices in a variety
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7085c7774def2bf6fec183e9b7c26969
https://doi.org/10.1002/imic.200790183
https://doi.org/10.1002/imic.200790183
This chapter gives a brief detail on the focused ion and electron beam techniques. A DualBeam is a focused ion beam (FIB) column and a scanning electron microscope (SEM) on the same platform. Commercial FIB columns generally use Ga ions and are avail
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4acc5630c87f86c7bc058c103a1f540
https://doi.org/10.1016/b978-0-8155-1594-4.00020-6
https://doi.org/10.1016/b978-0-8155-1594-4.00020-6
Autor:
Timo Aalto, Veli-Matti Airaksinen, Marco Amiotti, Olli Anttila, Paul A. Anzalone, Abhinav Bhushan, Antonio Bonucci, Jakub Bruzdzinski, Robert Candler, Kuo-Shen Chen, Andrea Conte, Cristina Davis, Viorel Dragoi, Simo Eränen, Sami Franssila, Alois Friedberger, Maria Ganchenkova, Lucille Giannuzzi, Miguel Gosálvez, Jakub Gronicz, Atte Haapalinna, Eero Haimi, Kimmo Henttinen, David Horsley, Akihisa Inoue, Henrik Jakobsen, Kerstin Jonsson, Dirk Kähler, Hannu Kattelus, Roy Knechtel, Kathrin Knese, Kai Kolari, Mika Koskenvuori, Heikki Kuisma, Adriana Lapadatu, Franz Laermer, Brandon Van Leer, Ari Lehto, Christina Leinenbach, Paul Lindner, Veikko Lindroos, Giorgio Longoni, Jari Mäkinen, Peter Merz, Douglas J. Meyer, Marco Moraja, Teruaki Motooka, Gerhard Müller, Shijo Nagao, Risto Nieminen, Roman Nowak, Juuso Olkkonen, Kuang-Shun Ou, Jari Paloheimo, Riikka Puurunen, Wolfgang Reinert, Steve Reyntjens, Tapani Ryhänen, Lauri Sainiemi, Hele Savin, Helmut Seidel, Parmanand Sharma, Scott Sullivan, Tommi Suni, Tuomo Suntola, Markku Tilli, Ilkka Tittonen, Santeri Tuomikoski, Örjan Vallin, Timo Veijola, Eeva Viinikka, Oliver Wilhelmi, Piotr Zachariasz, Irena Zubel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef2bccf297d0fb9b423198dd7d284265
https://doi.org/10.1016/b978-0-8155-1594-4.00050-4
https://doi.org/10.1016/b978-0-8155-1594-4.00050-4
Publikováno v:
2007 Digest of papers Microprocesses and Nanotechnology.
Application of state-of-the-art focused ion beam technology (FIB), in combination with high-performance scanning electron microscopy (SEM), gives the ability to perform advanced nanofabrication, via sputtering or chemical vapor deposition. Numerous p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e07b3f073744330782da16e3d2613d0
https://doi.org/10.1109/imnc.2007.4456310
https://doi.org/10.1109/imnc.2007.4456310