Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Oliver Oppermann"'
Autor:
Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Jan-Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer
Publikováno v:
Ultramicroscopy. 238:113535
In this paper we perform angular resolved annular-dark field (ADF) scanning-transmission electron microscopy (STEM) to study the scattered intensity in an InGaN layer buried in GaN as a function of the scattering angle. We achieved angular resolution
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23eb43d382551a29897d08dd15783250
https://doi.org/10.1016/j.ultramic.2022.113535
https://doi.org/10.1016/j.ultramic.2022.113535
Autor:
Oliver Oppermann, Knut Müller-Caspary, Tim Grieb, Andreas Beyer, Kerstin Volz, Christoph Mahr, Andreas Rosenauer, Saleh Firoozabadi, Florian F. Krause, Marco Schowalter
Publikováno v:
Ultramicroscopy 221, 113175-(2021). doi:10.1016/j.ultramic.2020.113175
The angle-resolved electron scattering is investigated in scanning-transmission electron microscopy (STEM) using a motorised iris aperture placed above a conventional annular detector. The electron intensity scattered into various angle ranges is com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b8e01028e5f2d34fff87211d23dbb458
https://juser.fz-juelich.de/record/893875
https://juser.fz-juelich.de/record/893875
Autor:
H. Ryll, Heike Soltau, Martin Simson, Florian F. Krause, Knut Müller-Caspary, Dennis Marquardt, Robert Ritz, Marco Schowalter, Andreas Rosenauer, Oliver Oppermann, Martin Huth
Publikováno v:
Ultramicroscopy 223, 113221-(2021). doi:10.1016/j.ultramic.2021.113221
Modern quantitative TEM methods such as the ζ -factor technique require precise knowledge of the electron beam current. To this end, a macroscopic Faraday cup was designed and constructed. It can replace the viewing screen in the projection chamber
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::224c59da934c96a4ba7e10730384df86
https://hdl.handle.net/2128/28578
https://hdl.handle.net/2128/28578
Autor:
Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, Kerstin Volz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35af24872c277573a5e8b5bb441b06f8
https://doi.org/10.1002/9783527808465.emc2016.5605
https://doi.org/10.1002/9783527808465.emc2016.5605
Autor:
Marco Schowalter, Florian F. Krause, Knut Müller-Caspary, Thorsten Mehrtens, Andreas Beyer, Pavel Potapov, Tim Grieb, Kerstin Volz, Oliver Oppermann, Andreas Rosenauer
Publikováno v:
Scientific Reports
Scientific reports 6, 37146 (2016). doi:10.1038/srep37146
Scientific reports 6, 37146 (2016). doi:10.1038/srep37146
Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::04432f61a8a3044c585dccb60c5e79af
https://pubmed.ncbi.nlm.nih.gov/27849001
https://pubmed.ncbi.nlm.nih.gov/27849001