Zobrazeno 1 - 10
of 46
pro vyhledávání: '"Olibet, S."'
Autor:
Cabrera, E., Olibet, S., Glatz-Reichenbach, J., Kopecek, R., Reinke, Daniel, Schubert, Gunnar
Publikováno v:
In Energy Procedia 2011 8:540-545
Publikováno v:
In Thin Solid Films 2009 517(23):6401-6404
28th European Photovoltaic Solar Energy Conference and Exhibition; 877-882
We present an effective solution to a very difficult issue - namely interface trap density, Dit, spectra measurements on silicon PV dielectrics that exhibit large dielect
We present an effective solution to a very difficult issue - namely interface trap density, Dit, spectra measurements on silicon PV dielectrics that exhibit large dielect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdb7a3ac49783838861f8149be71ee2a
28th European Photovoltaic Solar Energy Conference and Exhibition; 2059-2062
An industrially applicable PERC solar cell process was developed at ISC Konstanz that only uses a PECVD-based nitride passivation stack (“MSiN”) for rearside passiv
An industrially applicable PERC solar cell process was developed at ISC Konstanz that only uses a PECVD-based nitride passivation stack (“MSiN”) for rearside passiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc017aa1382bf546afff980681439934
Autor:
Wilson, M., Savtchouk, A., Korsós, F., Paráda, G., Kis-Szabo, K., Mihailetchi, V.D., Olibet, S.
27th European Photovoltaic Solar Energy Conference and Exhibition; 848-851
We present a small perturbation quasi-steady-state microwave detected photoconductance decay method that is significantly improved using novel quality of decay control te
We present a small perturbation quasi-steady-state microwave detected photoconductance decay method that is significantly improved using novel quality of decay control te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e77304ced89cc1b0f3bdfd6ff5b5635
Publikováno v:
22nd Workshop on Crystalline Silicon Solar Cells & Modules: Materials and Processes, Vail, Colorado, USA, 22-25 juli 2012., 5 p.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a69ef1569e587fa77e067a32121ed302
http://resolver.tudelft.nl/uuid:8cf52e4a-91b0-4255-9a1f-7b9264d02f60
http://resolver.tudelft.nl/uuid:8cf52e4a-91b0-4255-9a1f-7b9264d02f60
26th European Photovoltaic Solar Energy Conference and Exhibition; 979-983
The noncontact ac-surface photovoltage technique is modified to enable reliable measurement of the minority diffusion length in incoming silicon PV wafers. The modificati
The noncontact ac-surface photovoltage technique is modified to enable reliable measurement of the minority diffusion length in incoming silicon PV wafers. The modificati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d18c40f5032810c3dea4d8b4e6c6b19
Autor:
Sachs, E.M., Gabor, A.M., Madden, P., Olibet, S., Gates, H., Ersen, A., Tarasov, V., Harris, D., Passino, K., Van Mierlo, F., Queißer, S., Heeren, A., Kühnlein, H., Delahaye, F., Nussbaumer, H.
25th European Photovoltaic Solar Energy Conference and Exhibition / 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain; 1475-1478
We present novel methods for texturing and metallizing silicon-wafer base
We present novel methods for texturing and metallizing silicon-wafer base
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e095dd7b3f4615bdbc280e1d72988196
Autor:
Olibet, S., Monachon, C., Hessler-Wyser, A., Vallat-Sauvain, E., De Wolf, S., Fesquet, L., Damon-Lacoste, J., Ballif, C.
23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain; 1140-1144
In this article, we report on the use of transmission electron microscopy (TEM) for the fabrication of high-performance textured am
In this article, we report on the use of transmission electron microscopy (TEM) for the fabrication of high-performance textured am
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de6731be49fa728c06678569c0d49637